Detection method for particle size distribution of insulator surface dirt

Abstract

The invention discloses a detection method for particle size distribution of insulator surface dirt. The detection method comprises the following steps that the dirt amount of an insulator surface to be detected is judged; particle size distribution of the insulator surface dirt is measured with a laser particle size analyzer when it is judged that the dirt amount of the insulator surface is no less than a preset amount; an image of the insulator surface is shot with an electron microscope when it is judged that the dirt amount of the insulator surface is less than the preset amount; the image is analyzed to perform statistics on particle size distribution of the insulator surface dirt, and particle size distribution of the insulator surface dirt is measured. According to the detection method, defects of an existing laser particle size analyzer measurement method are overcome, and particle size distribution of the surface dirt of insulators in the regions with the lower pollution level, the shorter dirt accumulating period and the like can be measured and analyzed.

Description

Technical field [0001] The invention relates to a method for detecting the particle size distribution of contamination on the surface of an insulator. Background technique [0002] The contamination state of the insulator surface in different regions is inconsistent. The particle size distribution of the contamination is an important indicator for evaluating the contamination characteristics of the insulator surface. For the particle size distribution of contamination, most of them are now measured by laser particle size analyzer. [0003] The laser particle size analyzer measures the particle size distribution based on the physical phenomenon that particles can cause laser light to scatter. Because the laser has good monochromaticity and strong directivity, a parallel laser beam will illuminate infinitely far away in an infinite space without obstruction, and there is little divergence during the propagation process. When the beam is blocked by particles, a part of the light wil...

AI Technical Summary

Problems solved by technology

[0005] Laser particle size analyzer is fast and convenient for particle size distribution analysis, but requires a large amount of pollution. For lightly polluted areas, it is difficult to collect enough pollution, or the wo

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