Optical path simulation device for arc surface laser detector testing
A laser detector and arc surface technology, applied in the field of detector testing, can solve the problems of difference in hardware delay, large space occupation, complicated installation and disassembly steps, etc., and achieve the effects of convenient use, improved test accuracy and simple structure
Active Publication Date: 2018-09-18
BEIJING RES INST OF MECHANICAL & ELECTRICAL TECH
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Problems solved by technology
These methods have the disadvantages of cumbersome installation and disassembly steps, large space occupation, differences in hardware delays of different batches of devices, and complex functions of delay control circuits. cause a lot of trouble
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[0019] Embodiments of the present invention will be described below with reference to the drawings. Elements and features described in one drawing or one embodiment of the present invention may be combined with elements and features shown in one or more other drawings or embodiments. It should be noted that representation and description of components and processes that are not relevant to the present invention and known to those of ordinary skill in the art are omitted from the drawings and descriptions for the purpose of clarity.
[0020] refer to figure 1 , the present embodiment provides an optical path simulation device for arc surface laser detector testing, including:
[0021] A housing 101, the housing 101 is provided with an arc-shaped working surface compatible with the arc-shaped surface laser detector, and N transceiver windows 102 are arranged on the arc-shaped working surface, wherein N is an integer greater than or equal to 1;
[0022] The incident optical mod...
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The invention provides a light path simulation device for testing an arc-shaped surface laser detector. The light path simulation device comprises a shell, an incident optical module, an outgoing optical module and an optical fiber delay module. The shell is provided with an arc-shaped working surface fit with the arc-shaped surface laser detector, and the arc-shaped working surface is provided with N receiving-transmitting windows, wherein the N is an integer more than or equal to 1. The incident optical module is arranged to be fit with the receiving-transmitting windows, and used for coupling incident laser of the arc-shaped surface laser detector into an optical fiber; the outgoing optical module is arranged to be fit with the receiving-transmitting windows, and used for coupling the outgoing laser emitted from the optical fiber. The optical fiber delay module comprises a switch unit and M optical fibers with different lengths, and the switch unit is used for gating the optical fibers with different lengths to obtain light paths with different distances, and outputting the outgoing laser to the arc-shaped surface laser detector, wherein M is an integer more than N. According to the device, the distance differences of the return laser beam is simulated by using the length differences of the optical fibers, thus the testing accuracy is effectively improved, and the device is simple in structure, convenient to use and high in maintainability and replaceability.
Description
technical field [0001] The invention relates to the technical field of detector testing, in particular to an optical path simulation device for testing arc-shaped surface laser detectors. Background technique [0002] Optical path simulators are often used in the testing of laser detectors to assess the performance of laser detectors by simulating optical paths at different distances. At present, the optical path simulation device used for the test of the arc surface laser detector is generally installed in a multi-piece encircling manner, and the delay control circuit is used to control the delay time to simulate the optical path at different distances. These methods have the disadvantages of cumbersome installation and disassembly steps, large space occupation, differences in hardware delays of different batches of devices, and complex functions of delay control circuits. cause a lot of trouble. Contents of the invention [0003] A brief overview of the invention is gi...
Claims
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IPC IPC(8): H04B10/25H04B10/07G01D18/00
CPCG01D18/00H04B10/07H04B10/25891
Inventor 程龙刘伟魏清新王岩董齐
Owner BEIJING RES INST OF MECHANICAL & ELECTRICAL TECH