X-ray diffraction device with magnetic analysis function

Abstract

The invention relates to an X-ray diffraction device with a magnetic analysis function. The X-ray diffraction device comprises a sample stage, an X-ray source, a detector and a magnetic field generator. A glass slide can be fixed onto the sample stage, and a sample is mounted on the glass slide; the X-ray source is used for illuminating the sample with X-rays; the detector is used for detecting the X-rays reflected by the sample; the magnetic field generator is used for generating magnetic fields and applying the magnetic fields to the sample. The X-ray diffraction device has the advantages that the X-ray diffraction device further has the certain magnetic analysis function besides traditional functions and accordingly can replace neutron diffraction devices to a certain degree.

Description

technical field [0001] The present invention generally relates to an X-ray diffraction device, and more particularly, to an X-ray diffraction device with a magnetic analysis function. Background technique [0002] Since the 1990s, spintronics has been greatly developed, and various new experimental phenomena, new theories, and new practical devices have emerged one after another, driving sensors, memories, and magnetic devices that replace traditional semiconductor devices (or, in other words, self- The application and development of spin devices, such as spin transistors, spin logic devices, etc. The development of spintronics has also set off a research boom in the field of magnetic materials. [0003] X-ray diffraction device is a very important device for studying the composition of materials and their atomic-level structure, and is one of the most commonly used devices in the field of material research. Unfortunately, traditional X-ray diffraction devices do not have ...

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Problems solved by technology

The associated equipment (especially the accelerator) is large and complex, which limits the widespread use of neutron diffraction

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