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Test method and system

A test method and test source technology, which can be used in power supply testing, measuring devices, measuring electrical variables, etc., and can solve problems such as complexity and low circuit efficiency.

Active Publication Date: 2016-08-03
DELTA ELECTRONICS INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In order to make the circuit work normally under the test state, the efficiency under normal operation must be sacrificed, because the wider the gain range, the lower the circuit efficiency; if you want the circuit to have higher efficiency under normal operation, you must use some additional means. For example, more complex circuit structures and so on are obtained

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Embodiment Construction

[0025] Specific embodiments of the present application will be described in detail below. It should be noted that the embodiments described here are only used for illustration and are not used to limit the application.

[0026] The present application will now be described more fully hereinafter with reference to the accompanying drawings (in which example embodiments of the present application are shown). However, the present application can be implemented in many different forms, and the present application should not be construed as being limited to the embodiments presented herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of this application to those of ordinary skill in the art. Similar reference numbers refer to similar elements throughout.

[0027] The terminology used herein is only for describing specific embodiments, and is not intended to be a limitation of the present application. As...

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Abstract

The invention relates to a test method and system; the test method comprises the following steps: when a to-be-tested circuit enters an abnormal work state, a test control signal is outputted to a test source of the to-be-tested circuit, thus adjusting the input signal of the to-be-tested circuit, so a gain range of the to-be-tested circuit under abnormal work state can be same with that of the to-be-tested circuit under normal work state. The test method and system can satisfy power supply test requirements without sacrificing circuit efficiency under normal work state and adding circuit complex level.

Description

Technical field [0001] This application relates to power supply testing, in particular to a testing method and system. Background technique [0002] With the improvement of human requirements for intelligent life, the society's demand for data processing is increasing. The global energy consumption in data processing reaches hundreds of billions or even trillions of kilowatt-hours per year on average; and a large data center covers an area of ​​tens of thousands of square meters. Therefore, high efficiency, high power density and high reliability are the key indicators for the healthy development of this industry. [0003] The key unit of the data center is the server, and its motherboard is usually composed of CPU, chipsets, memory and other data processing chips, as well as its power supply and necessary peripheral components. figure 1 Shown is a schematic diagram of a motherboard power supply. Such as figure 1 As shown, the mainboard power supplies cascaded at all levels on th...

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Application Information

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IPC IPC(8): G06F1/28
CPCG01R31/40G01R19/16552G06F1/28G06F1/26
Inventor 曾剑鸿周子颖叶浩屹忽培青
Owner DELTA ELECTRONICS INC