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Probe device for impedance detection

A technology of impedance detection and lifting device, applied in the direction of measuring device, measuring resistance/reactance/impedance, measuring electricity, etc., can solve the problem of difficulty in adjusting the distance between the two probe heads and the circuit board, affecting the detection results of the probe device, etc. Compact structure, small space, and the effect of improving detection efficiency

Inactive Publication Date: 2016-08-31
JOINT STARS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this impedance probe device can only adjust the distance between the two probe heads. If the thickness of the circuit board to be detected is inconsistent, it is difficult to adjust the distance between the two probe heads and the circuit board, which will affect the probe device. The test results

Method used

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  • Probe device for impedance detection
  • Probe device for impedance detection
  • Probe device for impedance detection

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0072] Such as figure 1 As shown, this embodiment provides a probe device for impedance detection, including

[0073] Chassis 1

[0074] The first fixing structure 2 is arranged perpendicular to the chassis 1 and the bottom is fixed on the chassis 1;

[0075] A first probe assembly 3 is vertically arranged on the end of the first fixing structure 2;

[0076] The second fixed structure 4 is parallel to the first fixed structure 2, and is movably arranged on the chassis 1 through the driving device 8;

[0077] A second probe assembly 5 is vertically arranged on the end of the second fixed structure 4, opposite to the first probe assembly 3 and used for detecting the impedance of the circuit board. Under the movement of the second fixed structure 4, it drives the The second probe assembly 5 moves toward or away from the first probe assembly 3;

[0078] The two first lifting devices 6 are respectively arranged on the ends of the first fixed structure 2 and the second fixed structure 4, and ...

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Abstract

The invention discloses a probe device for impedance detection. The probe device comprises a chassis; a first fixing structure and a second fixing structure vertical to the chassis; at least one first probe assembly and at least one second probe assembly which are respectively arranged on the end part of the first fixing structure and the end part of the second fixing structure, wherein the second probe assembly and the first probe assembly are opposite to each other in one-to-one correspondence and are used for detecting the impedance of a circuit board in a matched manner, the first fixing structure is fixed on the chassis, and the second fixing structure is movably arranged on the chassis through a driving device; and at least two first lifting devices used for respectively driving the first probe assembly and the second probe assembly to move up and down so as to adjust the heights of the first probe assembly and the second probe assembly anytime according to the thickness of a circuit board when the impedance detection is carried out on circuit boards different in thickness. In this way, the first probe assembly and the second probe assembly are enabled to contact the surface of the circuit board, and impedance detection on the circuit board is completed under the cooperation of the two probe assemblies.

Description

Technical field [0001] The invention relates to the technical field of circuit board impedance detection, and in particular to a probe device for impedance detection. Background technique [0002] In the prior art, after a circuit with a desired shape is prepared on a circuit board, an impedance detection probe needs to be used to detect the circuit on the circuit board, and the detection result is used to determine whether the circuit on the circuit board meets the requirements. [0003] Chinese Patent Document CN203385768U discloses a circuit board impedance detection probe device, which includes a housing with an opening facing upwards, an upper cover arranged on the opening of the housing; two probe assemblies arranged in the housing, the probe assembly including a cable, The probe heads and connection terminals at both ends of the cable, the end of the probe head far from the end of the cable is located outside the housing, and the wiring terminal is located outside the housin...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/02G01R31/28
CPCG01R27/02G01R31/2808G01R31/2812
Inventor 赵凌云
Owner JOINT STARS TECH
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