A modular digital integrated circuit radiation effect online testing system and testing method

Abstract

The invention relates to a system and method for the online testing of a radiation effect of a modular digital integrated circuit, and the system enables all needed function circuits in the effect testing to be divided into relatively independent modules on the basis of summarizing the similarities and differences of conventional digital integrated circuit radiation effect online testing systems. The electrical and mechanical connection among the modules, the design in the modules and the mechanical structure of a system board respectively employ conventional industrial standards, thereby achieving a purpose that a system can employ a commercial module or an independently developed modular for quick connection, enabling the system to be better in expandability, and saving the design time and cost of hardware. The method can be used for the majority of the online testing of the radiation effect of digital integrated circuits of bullets and satellites. The system plays an important role in standardizing a national radiation effect online testing system.

Description

technical field [0001] The invention relates to the test of radiation effects of digital integrated circuits, in particular to an on-line test system for radiation effects of modularized digital integrated circuits. Background technique [0002] The natural radiation environment and nuclear radiation environment in space will produce total dose, single particle, neutron displacement and instantaneous dose rate effects in electronic devices, which will lead to the degradation of electrical parameters or even functional failure of electronic devices, seriously affecting spacecraft and strategic weapons Therefore, it is necessary to accurately measure the electrical parameters and functional changes of electronic devices during the radiation process on the ground to provide data for the evaluation of the radiation resistance performance of electronic devices. [0003] The radiation effect test of electronic devices is divided into online and offline tests. Among them, the onli...

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Problems solved by technology

[0011] In addition, because the radiation effect test methods of various digital integrated circuits have not yet formed a unified understanding and specification in China, the measurement systems developed by different units are quite different, and the obtained radiation resistance performance test data are incomparable, resulting in a lot of waste of resources , put forward requirements for the normalization and standardization of the test system

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