Automatic appearance inspection apparatus for chip inductor

Abstract

The invention discloses an automatic appearance inspection apparatus for a chip inductor. The automatic appearance inspection apparatus comprises a base; one side of the base is provided with a fixed plate; a computer input keyboard is arranged on the fixed plate; the side, perpendicular to the fixed plate, of the base is provided with a support; the support is provided with a computer through a fixed part; the side, far away from the support, of the computer is provided with a supporting seat; the supporting seat is mounted on the base; the side, far away from the base, of the supporting seat is equipped with a feeding device; a rotating disk is arranged on the central part of the upper end surface of the base; the side, far away from the base, of rotating disk is provided with a stepping motor; the edge of one side of rotating disk is provided with a material recovering box; and the upper end of the material recovering box is provided with a discharging device. The apparatus provided by the invention employs a computer integrated and programmed design and is simple to operate; after connection with a networking wire, the apparatus can carry out remote monitoring and remote data acquisition and realize unmanned operation; and the apparatus is simple to operate, easy to produce and suitable for extensive promotion.

Description

technical field [0001] The invention relates to the technical field of industrial equipment, in particular to a fully automatic appearance inspection device for patch inductors. Background technique [0002] The appearance inspection system is mainly used to quickly identify the appearance defects of the sample, such as pits, cracks, warping, gaps, stains, sand, burrs, air bubbles, uneven color, etc. The sample to be inspected can be transparent or opaque , In the past, product appearance inspection was generally done by naked eyes, so there may be human factors that lead to inconsistent measurement standards, and long-term inspections may cause misjudgments due to visual fatigue. With the in-depth cooperation of computer technology and optical, mechanical, electrical and other technologies, it has the characteristics of fast and accurate detection. At present, the appearance inspection of chip inductors in the market relies on manual visual inspection, which has slow operat...

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Problems solved by technology

[0002] The appearance inspection system is mainly used to quickly identify the appearance defects of the sample, such as pits, cracks, warping, gaps, stains, sand, burrs, air bubbles, uneven color, etc. The sample to be inspected can be transparent or opaque , in the past, the product appearance inspection was generally done by naked eyes, so there may be human factors that lead to inconsistent measurement standards, and long-term inspections may cause misjudgments due to visual fatigue

With the in-depth cooperation of computer technology and optical, mechanical, electrical and other technologies, it has the characteristics of fast and accurate detection. At present, the appearance inspection of chip inductors in the market relies on manual visual inspection, which has slow operating efficiency and misjudgment rate. High, high production costs, there is no fully automated visual inspection equipment in the market

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