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Verify gate driver protection logic

A gate driver and gate signal technology, applied in the direction of instruments, electrical solid-state devices, semiconductor devices, etc., can solve the problems of increasing system size, cost complexity, damage to the system, etc.

Active Publication Date: 2019-01-22
INFINEON TECH AG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Additional hardware may increase the size, cost and / or complexity of the system and may damage the system in the event of failure of the protection features

Method used

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  • Verify gate driver protection logic
  • Verify gate driver protection logic
  • Verify gate driver protection logic

Examples

Experimental program
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Effect test

Embodiment Construction

[0016] figure 1 Shown is a conceptual diagram of a system 1 including a gate driver 4 configured to test the internal protection logic of the gate driver according to one or more aspects of the present disclosure. In addition to the driver 4 , the system 1 also includes a control module 12 and a device 14 .

[0017] The exemplary system represented by System 1 includes one or more semiconductor modules or "devices" driven by gate drivers that include monitoring and / or protection features to prevent , overvoltage condition, overcurrent condition or other fault condition) during damage to the semiconductor module. For example, System 1 may be an automotive system (e.g., a lighting system, driveline, or other automotive system), an electrical and distribution system, a computer system, a power conversion system, or any other system that includes one or more A semiconductor element and a driver configured to protect the semiconductor element from a fault condition.

[0018] Dev...

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Abstract

A gate driver is described that includes a gate signal module configured to output a gate signal of the gate driver for driving a gate terminal of a semiconductor device. The gate driver further includes a test module configured to generate a simulated failure condition at a semiconductor device during a test of a monitoring and protection feature of the gate driver. The gate drier further includes a monitor module configured to output an indication of the simulated failure condition in response to detecting the simulated failure condition at the semiconductor device.

Description

technical field [0001] In general, the present disclosure relates to a gate driver and a method for testing monitoring and protection features of the gate driver. Background technique [0002] Some systems rely on semiconductor modules consisting of one or more insulated-gate bipolar transistor (IGBT) devices, metal-oxide-semiconductor field-effect transistor (MOSFET) devices, or other types of transistor-based devices. Some systems drive the device gates of semiconductor modules by using specialized gate driver integrated circuits (ICs) that include fault condition monitoring and / or protection features to prevent For example, damage to the module during an accidental short circuit, overtemperature, overvoltage condition, overcurrent condition, or other fault condition). [0003] For example, high-power automotive drivetrains often include one or more semiconductor modules as power switches that control the input and output of electrical power to the engine. The gate drive...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H02M1/088G01R31/00
CPCG01R31/2621G01R31/3187G05F1/00H01L21/00H01L2221/00
Inventor T·巴希加鲁波M·巴赫胡博L·博瑞瑙特M·纽布灵
Owner INFINEON TECH AG
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