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Light scattering measurement system and method for particulate matters

A light scattering measurement and scattering measurement technology, applied in the field of particle light scattering measurement system, can solve the problems of difficulty in measuring particle properties, high price, and reduced measurement accuracy.

Inactive Publication Date: 2016-10-12
ZHONGXING INSTR SHENZHEN
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Problems solved by technology

[0003] The traditional methods for determining the source of particulate matter mainly include mass spectrometry, ion chromatography (IC), X-rays, and thermo-optic methods. Among them, mass spectrometry and ion chromatography analysis methods can obtain the most comprehensive information on the composition of particulate matter, but they mostly use offline methods. The processing work is cumbersome, and it also leads to the inactivation of certain components and the reduction of measurement accuracy. At the same time, there are also problems such as complex instruments, difficult maintenance, and expensive prices, making it difficult to promote and apply on a large scale
[0004] With the increasing development of optical technology, light scattering technology has become a non-contact fast online measurement technology for particles. At present, in the aspect of online monitoring of particles, single-angle light scattering technology is usually used to measure particle size, but it is still difficult to realize Problems Measuring Particulate Matter Properties

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  • Light scattering measurement system and method for particulate matters

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Embodiment Construction

[0048] see figure 1 , the particle light scattering measurement system of the embodiment of the present invention is used to measure the concentration, particle size and properties of the particles in the gas. The particle light scattering measurement system includes a scattering measurement chamber 1, a light source 2 installed on one side of the scattering measurement chamber 1, a light source polarizer 3, a scattered light analyzer 4 located at different scattering angles, and a scattered light detector 5 and data acquisition and analysis module 6.

[0049] The scattering measurement chamber 1 includes an optical channel 11 and a particle sampling channel 13 intersecting the optical channel 11 . In one embodiment, the optical channel 11 perpendicularly intersects the particle sampling channel 13 .

[0050] In one embodiment, the scatterometry chamber 1 is in the shape of a strip.

[0051] In one embodiment, the optical channel 11 is arranged horizontally, and the particu...

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Abstract

A light scattering measurement system for particulate matters comprises a scattering measurement chamber, a light source, a scattering light detector, a data acquisition and analysis module, a light source polarizing device and a plurality of scattering light polarization analyzers. The scattering measurement chamber includes a light channel and a particulate matter sample injecting channel, a center line of the light channel and a center line of the particulate matter sample injecting channel intersect at an intersection point. The light source is mounted on one side of the scattering measurement chamber. The light source polarizing device is positioned between the scattering measurement chamber and the light source. The multiple scattering light polarization analyzers are arranged at positions differently angled with the center line of the light channel from the intersection point as a start point; the scattering light detector is arranged in correspondence with the multiple scattering light polarization analyzers and used for receiving light from the multiple scattering light polarization analyzers. The invention also provides a light scattering measurement method for particulate matters. The particulate matters are measured based on a particulate matter multi-angle scattering method, and particle sizes and attributes of the particulate matters can be determined.

Description

technical field [0001] The invention relates to the field of particle measurement, in particular to a particle light scattering measurement system and method. Background technique [0002] In recent years, the problem of atmospheric "haze" that has attracted much attention from the society has attracted great attention from the international community and the Chinese government. Cities with heavy pollution should take the lead in analyzing the source of atmospheric particulate matter to provide technical support for air pollution prevention and management. [0003] The traditional methods for determining the source of particulate matter mainly include mass spectrometry, ion chromatography (IC), X-rays, and thermo-optic methods. Among them, mass spectrometry and ion chromatography analysis methods can obtain the most comprehensive information on the composition of particulate matter, but they mostly use offline methods. The processing work is cumbersome, and it also leads to...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/00G01N15/02G01N15/06
CPCG01N15/00G01N15/0211G01N15/06G01N15/075
Inventor 宾泽明刘燕林文新江邱致刚
Owner ZHONGXING INSTR SHENZHEN
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