Quantitative detection method for surface defects of high-order curved optical components
A quantitative detection method and high-order surface technology, applied in the direction of optical testing flaws/defects, material analysis through optical means, measuring devices, etc., can solve problems such as strong subjectivity, poor repeatability, and inconsistent standards of visual methods. Achieve the effect of improving advanced optical manufacturing ultra-precision processing technology, improving detection efficiency and detection accuracy
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[0043] Below, embodiment 1 of the present invention will use Figure 1-6 to describe in detail.
[0044] Such as figure 1 As shown, the quantitative detection method for surface defects of high-order curved optical components specifically includes the following steps:
[0045] Step 1. Obtain defect information on the full-aperture surface of the high-order curved optical element 40 by means of sub-aperture scanning and stitching. Based on the latitude and longitude line scanning trajectory method of high-order curved surface, the scanning path is optimized through sub-aperture planning and the spatial distribution of sub-apertures on the surface of high-order curved surface is determined, so as to cover the full aperture range of the measured component with a small number of sub-apertures; the said The high-order surface is a rotating high-order surface with the Z axis as the axis of rotation, including spherical surfaces, quadric surfaces (paraboloids, ellipsoids, etc.), hi...
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