Wave band selecting method for determinant point process

A technology of band selection and point process, applied in the field of image processing, can solve problems such as poor discrimination, achieve the effect of reducing data dimension and overcoming large amount of calculation

Active Publication Date: 2016-10-19
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0006] In order to solve the above-mentioned technical problems, the present invention proposes a band selection method of determinant point process, which solves the high redundancy existing in the original hyperspectral data, improves the problem of data expression, and overcomes the problem of poor discrimination of existing methods

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  • Wave band selecting method for determinant point process
  • Wave band selecting method for determinant point process
  • Wave band selecting method for determinant point process

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Embodiment Construction

[0022] refer to figure 1 , the steps that the present invention realizes are as follows:

[0023] Step 1, generate different candidate band subsets.

[0024] (1a) Divide the image set in the raw hyperspectral data into different band subsets. Create a flag vector for the selected band, the selected band is marked with 1, otherwise it is 0.

[0025] (1b) Randomly select K bands as a subset of bands for initial testing, where the number of 1s in the flag vector is K;

[0026] Step 2, establishing evaluation criteria for evaluating the quality of the band subset. Assuming that the candidate subset conforms to a determinant point process, the bands in this subset are strongly differentiated.

[0027] Builds the determinant point process probability for the subset. Let X be the original hyperspectral data, the size is p×q, where p is the number of bands, and q is the total number of pixels in each band. A is a flag vector for selecting a subset of bands, and Y is a non-zero i...

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Abstract

The invention provides a wave band selecting method for a determinant point process. The wave band selecting method comprises the steps of 1), dividing the wave band of original hyperspectral data, and generating different candidate wave band subsets; 2), evaluating the wave band subsets, and selecting a candidate waveband subset which accords with the determinant point process; and 3), according to the property of an elementary determinant point process, calculating appearance probability of the candidate wave band subset which accords with the determinant point process, and probability increase represents appearance probability increase of an optimal candidate wave band subset. The wave band selecting method has advantages of settling a problem of high redundancy in the original hyperspectral data, improving data expression, and overcoming a defect of low discriminative property in an existing method.

Description

technical field [0001] The invention belongs to the technical field of image processing, and in particular relates to a hyperspectral band selection, in particular to a band selection method for a determinant point process. Background technique [0002] With the development of remote sensing technology and imaging spectrometers, hyperspectral remote sensing images are more and more widely used, but their characteristics of large number of bands and huge data volume have brought great difficulties to the classification and identification of hyperspectral images. For example, the information redundancy is high, the space required for data storage is large, the processing time is long, and because the hyperspectral image has a large number of bands, it is prone to the curse of dimensionality, that is, the classification accuracy is reduced. Therefore, in the case of ensuring the classification and recognition rate of ground objects, it is very necessary to reduce the amount of ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/62
Inventor 袁媛卢孝强郑向涛
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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