IC element solder joint detection method based on robust principal component analysis
A technology of principal component analysis and solder joint detection, which is applied in the fields of material analysis, material analysis through optical means, and measuring devices, etc. It can solve problems such as unsatisfactory model training results, inhibition, and inaccurate detection results.
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[0054] refer to figure 1 , the invention provides a kind of IC component solder joint detection method based on robust principal component analysis, comprising steps:
[0055] S1. After collecting a plurality of test pictures of solder joints of IC components to be tested, a test set is formed;
[0056] S2. After each test picture of the test set is vectorized into a column vector, all the obtained column vectors are merged into an IC solder joint test matrix;
[0057] S3. Optimizing and decomposing the IC solder joint test matrix to obtain its low-rank matrix and sparse matrix;
[0058] S4. Inversely quantize each column vector of the sparse matrix to obtain a corresponding picture, and then perform binary segmentation on each picture to obtain a corresponding binary image;
[0059] S5. After obtaining the frequency distribution map obtained according to the training sample training, calculate the defect degree of each test picture in combination with the binarized image; ...
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