Physical unclonable function response error correcting circuit based on SRAM type memory

Abstract

The invention discloses a physical unclonable function response error correcting circuit based on an SRAM type memory. The physical unclonable function response error correcting circuit based on the SRAM type memory comprises a coding module, a decoding module and a control module, wherein the coding module is used for mapping the physical unclonable function response into a uniquely corresponding position code sequence by being combined with a key sequence formed by a random number through a specific coding rule; the decoding module is used for reversely mapping the physical unclonable function response by combining the original position code sequence for reducing the key sequence; the control module realizes the coding and decoding conversion, the time sequence and address generation, circuit control between module circuits and similarity calculation between a key before coding and a key after the coding. The physical unclonable function response error correcting circuit has the advantages that the instability of the SRAM PUF response is overcome; the unstable SRAMPUF response is output and converted into the stable mapping relationship between the key and the position code, so that the hardware identity authentication is realized; the identity authentication safety is improved; the authentication process is simplified; the authentication efficiency is improved; the hardware cost is reduced.

Description

technical field [0001] The invention relates to a physically unclonable function response error correction circuit based on an SRAM memory, belonging to the technical field of information security. Background technique [0002] The physical unclonable function PUF refers to a physical entity that can rely on the differences in the manufacturing process to produce its unique output. The stimulus C input to the PUF structure and the resulting response R are called the stimulus-response pair CRP. In some cases, the PUF structure is considered as a mapping function that matches the stimulus response. For the same PUF structure, inputting the same excitation multiple times will produce different responses. The difference in response is caused by some irregular noise, measurement error and changes in the surrounding environment such as temperature, voltage, etc., and the difference between the responses It is called the intra-chip Hamming distance. In order to make the response...

AI Technical Summary

Problems solved by technology

But the greater the difference in the responses of two different PUF structures, the easier it is to distinguish the two

Since no two PUF structures can produce the same stimulus-response pair, PUFs cannot be cloned

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