A lighting test device
A technology for testing equipment and positioning card slots, which is applied in the direction of measuring electricity, measuring devices, and measuring electrical variables, etc., and can solve the problems affecting the test quality of lighting test equipment, the misalignment of test probes, and the alignment accuracy of lighting test equipment and display panels Low-level problems, to achieve the effect of improving test quality, high alignment accuracy, and easy alignment
Inactive Publication Date: 2020-08-11
BOE TECH GRP CO LTD
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- Application Information
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Problems solved by technology
However, in the prior art, since the area occupied by each test point on the display panel is small, the alignment contact between the test probe and the test point can be considered as a point-to-point alignment contact, so that the placement error of the display panel or the display The cutting error of the panel at the test point will easily cause the misalignment of the test probe, so that the alignment accuracy between the lighting test equipment and the display panel is low, which affects the test quality of the lighting test equipment
Method used
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[0030] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.
[0031] For the lighting test equipment provided by the embodiment of the present invention, refer to Figure 1 to Figure 5 As shown, it includes a backlight source 11, which is used to provide a light source to the display panel 12 to be tested, and also includes: a positioning card slot 13, a plurality of conductive contacts 131 are arranged on the inner side wall of the positioning card slot 13, and the display to be tested The panel 1...
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The embodiment of the invention discloses a lighting test equipment and relates to the field of a testing technology of a display device. By adopting the lighting test equipment, alignment precision between the equipment and a to-be-tested display panel can be improved and testing quality of the equipment is promoted. The lighting test equipment comprises a back light source, a positioning clamping slot and a signal supply unit; the back light source is used for providing the light source to the to-be-tested display panel; multiple conductive contact pieces are arranged on the inside wall of the positioning clamping slot; the to-be-tested display panel can be inserted into the positioning clamping slot so that testing points of the to-be-tested display panel correspondingly contact with the conductive contact pieces; the signal supply unit is used for providing testing signals to the conductive contact pieces. The equipment is applied to lighting test of the display panel.
Description
Technical field [0001] The invention relates to the technical field of display device testing, in particular to a lighting test equipment. Background technique [0002] In the prior art, after the display panel is manufactured, it is usually necessary to use a lighting test device to perform a lighting test on the display panel, that is, the test point on the display panel is loaded with signals through the lighting test device to test the display quality of the display panel. [0003] When using traditional lighting test equipment to perform lighting test for the display panel, first place the display panel on the workbench of the lighting test equipment; then use a robotic arm or manually connect the test probes on the lighting test equipment to the test points on the display panel Make a counterpoint contact to complete the lighting test. However, in the prior art, since each test point on the display panel occupies a small area, the alignment contact between the test probe and...
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IPC IPC(8): G01R1/04G01R31/00
CPCG01R1/0408G01R31/00
Inventor 王锦谦王铁石
Owner BOE TECH GRP CO LTD