Focused shock wave excitation device for dynamic feature testing of microstructure of MEMS (micro-electromechanical system)
A technology of excitation device and dynamic characteristics, which is applied in the field of focused shock wave excitation device, can solve problems such as the difficulty of microstructure dynamic characteristic parameters, and achieve the effects of good excitation effect, concentrated energy, and easy testing
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[0026] like Figure 1-Figure 3 As shown, the present invention relates to a focused shock wave excitation device for testing the dynamic characteristics of MEMS microstructures, comprising a substrate 1, and a manual three-axis displacement stage 6 and a support 2 are arranged on the substrate 1. The manual three-axis The displacement stage 6 is mounted on a base plate 7 , and the base plate 7 is fixed on the base plate 1 by screws 8 . A microstructure unit 4 is provided on the Z-axis slide 9 of the manual three-axis displacement stage 6;
[0027] like Figure 7-Figure 9 As shown, the micro-structure unit 4 includes a mounting sleeve 401 which is mounted on the Z-axis slide 9 through the horizontal support 10. The mounting sleeve 401 is provided with a stepped mounting hole. The MEMS microstructure 405 is installed on the structure mounting plate 407; the microstructure mounting plate 407 is fixed on the annular plane at the bottom of the mounting hole through the screws 406...
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