Method and device for selecting support points in metric space

Abstract

The invention discloses a method and a device for selecting a support point in a metric space. The method comprises the following steps: selecting a datum in a target data set according to a preset rule, and taking the selected datum as a support point; taking the other data except the selected datum serving as the support point in the target data set as data to be calculated; calculating distances between the data to be calculated and a support point which is selected lastly, and determining minimum distance values according to a comparison result between the calculated distances and pre-stored distance values; and selecting a datum corresponding to a minimum distance value which has a maximum numerical value in the minimum distance values, and taking the selected datum as the support point. Peripheral points of the metric space can be taken as preferable support points, so that the peripheral points of the metric space can be rapidly and accurately selected by calculation of a preset number of support points which are selected lately; the data management and analysis performance of the metric space is enhanced; and meanwhile, the indexing efficiency is increased.

Description

technical field [0001] The invention belongs to the technical field of computers, in particular to a method and device for selecting support points in a metric space. Background technique [0002] Metric space is an abstraction that covers a wide range of data types. The biggest advantage of metric space is its high universal applicability, users only need to provide distance function to search for data similarity. However, the data is abstracted into points in the metric space, which improves the generality, but also loses the coordinate information, and the only available information is the distance value. Since there are no coordinates, many mathematical tools cannot be used directly. The general method is to first find out some pivots, and then use the distance from the data to the pivots as the coordinates. Therefore, the quality of the selected support points plays a key role in the performance of metric spatial data management analysis. [0003] In the prior art, ...

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Problems solved by technology

[0005] The present invention provides a method and device for selecting a support point in a metric space, aiming to solve the problem that the FFT algorithm in the prior art cannot accurately and quickly select the surrounding area because the optimal support point is a point located on the periphery of the metric space points, thereby affecting the performance of metric spatial data management analysis

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