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Method for pre-estimating strong scattering points between conductor flat plate and non-parallel medium surface under point source excitation

A strong scattering point, non-parallel technology, applied in the field of electromagnetic scattering simulation calculation, can solve the problem that the multi-layer Green's function method in the complex mirror method is not given, and achieves the effect of small calculation amount and improved accuracy

Active Publication Date: 2017-05-31
SHANGHAI RADIO EQUIP RES INST +1
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  • Claims
  • Application Information

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Problems solved by technology

A fast algorithm for calculating the Sommerfeld integral in the Green's function is given in the prior art, but there is no method for solving the multi-layer Green's function in the complex image method
However, the patent CN104778286 "Quick Simulation Method for Electromagnetic Scattering Characteristics of Sea-skimming Aircraft" provides a fast calculation method for compound scattering of target and medium surface. Computing time and memory requirements often exceed the capacity of the computer

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  • Method for pre-estimating strong scattering points between conductor flat plate and non-parallel medium surface under point source excitation
  • Method for pre-estimating strong scattering points between conductor flat plate and non-parallel medium surface under point source excitation
  • Method for pre-estimating strong scattering points between conductor flat plate and non-parallel medium surface under point source excitation

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Embodiment Construction

[0063] The following combination Figure 1 ~ Figure 3 , a preferred embodiment of the present invention is described in detail.

[0064] Such as figure 1 As shown, the method for estimating strong scattering points between a conductor plate and a non-parallel medium surface under the excitation of a point source according to the present invention includes the following steps:

[0065] S1. Obtain the Green's function of the infinite conductor plate;

[0066] S2. Acquiring the Green's function of the half-space medium surface;

[0067] S3, performing edge diffraction correction on the finite-sized conductive flat plate, and obtaining the Green's function of the finite-sized conductive flat plate;

[0068] S4. Based on S2 and S3, estimate the position of the strong scattering point.

[0069] In the above S1, the half-space Green's function of the conductor interface can be equivalent to the free-space Green's function of the mirror image of the point source. Such as figure...

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Abstract

The invention relates to a method for pre-estimating strong scattering points between a conductor flat plate and a non-parallel medium surface under point source excitation. The method comprise the steps of S1, acquiring a Green function of an infinite conductor flat plate by adopting a single mirror image method; S2, acquiring a Green function of a half-space medium surface by adopting a discrete complex image method; S3, performing edge diffraction correction on a conductor flat plate of a limited size, and acquiring a Green function of the conductor flat plate of a limited size; S4, performing two-dimensional imaging based on the Green function of the half-space medium surface and the Green function of the conductor flat plate of a limited size, and acquiring location information of the strong scattering points between the conductor flat plate and the non-parallel medium surface under point source excitation. According to the invention, the Green function of the conductor flat plate of a limited size is corrected through edge diffraction, so that the accuracy of location pre-estimation for the strong scattering points is effectively improved; and the calculation amount is small, and requirements of engineering applications are met.

Description

technical field [0001] The invention relates to a method for predicting strong scattering points of a conductor flat plate and a non-parallel medium surface under excitation of a point source, and belongs to the field of electromagnetic scattering simulation calculation. Background technique [0002] In the near-field measurement of a large low-scattering target in a non-darkroom environment, there is coupling scattering between the target and the ground directly below it, and it is difficult to suppress and eliminate the coupling clutter by blocking the interference path. In order to improve the accuracy of near-field measurement, it is necessary to accurately predict the position information of the strong scattering point formed between the target and the ground directly below it. Considering that the bottom of the target often satisfies the characteristics of slow deformation, the problem can be simplified as the estimation of the position of the strong scattering point b...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S7/41G01S13/89G06F17/14
CPCG01S7/41G01S13/89G06F17/14
Inventor 吴语茂高鹏程杨杨张楠童广德
Owner SHANGHAI RADIO EQUIP RES INST