KNL-based testing method and system

A test method and test system technology, applied in the field of high-performance computing, can solve problems such as constraining SOC and shortening operation time

Active Publication Date: 2017-06-13
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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AI Technical Summary

Problems solved by technology

[0003] The test scheduling problem has seriously constrained the development of SOC. This problem has been proved to be an NP-complete problem (Non-deterministic Polynomia, a non-deterministic problem of polynomial complexity). In the prior art, most researchers have introduced genetic algorithms and integer linear However, these algorithms have certain problems in algorithm complexi

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  • KNL-based testing method and system

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Embodiment Construction

[0036] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0037] The embodiment of the present invention discloses a kind of test method based on KNL, see figure 1 As shown, the method includes:

[0038] Step S11: The master node obtains the test task set, and distributes the test task subsets in the test task set to the KNL slave node set.

[0039] Specifically, after the master node obtains the test task set, it divides the test tasks in the test task set into multiple test task subsets, and can use the number of ...

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Abstract

The invention discloses a KNL-based testing method. The KNL-based testing method comprises the following steps: acquiring a testing task set by a main node, and distributing a testing task subset in the testing task set into a KNL secondary node; and when the KNL secondary node receives the testing task subset, distributing the testing tasks in the testing task subsets into a progress set, and calculating the testing task in each progress by an ant colony algorithm to obtain the testing result, wherein the progress number in the progress set is less than or equal to the task number of the testing task subset. Thus, after the main node acquires the testing task set, the testing tasks are distributed to a KNL secondary node set, the KNL secondary node in the KNL secondary node set receives the testing task subset, the testing task in each progress is calculated by the ant colony algorithm to obtain the counting result, the testing tasks are processed in parallel through a plurality of KNL servers, the calculation load is improved, and calculation is conducted by the ant colony algorithm, in conclusion, the processing speed of the testing tasks is increased.

Description

technical field [0001] The invention relates to the field of high-performance computing, in particular to a KNL-based testing method and system. Background technique [0002] With the development of integrated circuit technology, SOC (System on Chip, system-on-chip) based on intellectual property core multiplexing technology is developing rapidly. However, as the SOC functions become more and more complex, the types and quantities of intellectual property cores integrated in the SOC are increasing, which makes the SOC test time longer and higher, and the test cost is also higher. The test scheduling problem is an important part of the SOC test, and has become the primary problem to be solved urgently in the SOC system level test. [0003] The test scheduling problem has seriously constrained the development of SOC. This problem has been proved to be an NP-complete problem (Non-deterministic Polynomia, a non-deterministic problem of polynomial complexity). In the prior art, ...

Claims

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Application Information

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IPC IPC(8): G06F9/48
CPCG06F9/4843
Inventor 黄雪董昊
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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