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A method and device for measuring memory ip core pin capacitance

A technology of memory and pins, which is applied in the field of memory compilation, can solve the problems of large amount of data processing, simulation failure, slow extraction of RC parameters, etc., and achieve the effect of improving verification efficiency and fast measurement

Active Publication Date: 2020-04-14
SPREADTRUM COMM (SHANGHAI) CO LTD
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Since the RC parameters are extracted for the entire memory IP core, the extraction speed of the RC parameters is very slow, especially when encountering a large-sized memory IP core, the RC parameters may not be extracted at all; further, even if the RC parameters can be extracted , but when using the simulation tool for simulation, due to the large amount of data processed by the simulation tool, the simulation speed will be very slow, and even the simulation may fail

Method used

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  • A method and device for measuring memory ip core pin capacitance
  • A method and device for measuring memory ip core pin capacitance
  • A method and device for measuring memory ip core pin capacitance

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Embodiment Construction

[0050] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is only some embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0051] The present invention provides a method for measuring memory IP core pin capacitance, such as figure 1 As shown, the method includes:

[0052] S11. Extract the RC netlist of each sub-module included in the memory IP core.

[0053] S12. Merge the RC netlist of each submodule into a first RC netlist according to the stitching rule of t...

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Abstract

The invention provides a method and device for measuring the capacitance of a memory IP core base pin. The method includes the steps: an RC net list of each sub module contained in a memory IP core is extracted; according to a splicing rule of the memory IP core, the RC net lists of the sub modules are spliced into a first RC net list, wherein the first RC net list is an RC net list of the memory IP core; and the first RC net list is simulated by a simulation tool, and a measurement value of the capacitance of the memory IP core base pin is obtained. The capacitance of the memory IP core base pin can be measured rapidly.

Description

technical field [0001] The invention relates to the technical field of memory compilation, in particular to a method and device for measuring the capacitance of memory IP core pins. Background technique [0002] In the process of generating a memory IP (intellectual property, intellectual property) core by using a memory compiler, it is necessary to measure the pin capacitance of the memory IP core to describe the pin information of the memory IP core. The existing method of measuring memory IP core pin capacitance is usually to extract the RC parameters of the memory IP core, wherein the RC parameter is a parasitic parameter, which includes parasitic resistance and parasitic capacitance, and then uses a simulation tool to measure the pins of the memory IP core capacitance to verify the circuit performance of the generated memory IP core. [0003] In the process of realizing the present invention, the inventor found that there are at least the following technical problems i...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/56
CPCG11C29/56
Inventor 诸月平王林
Owner SPREADTRUM COMM (SHANGHAI) CO LTD