A method and device for measuring memory ip core pin capacitance
A technology of memory and pins, which is applied in the field of memory compilation, can solve the problems of large amount of data processing, simulation failure, slow extraction of RC parameters, etc., and achieve the effect of improving verification efficiency and fast measurement
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0050] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is only some embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0051] The present invention provides a method for measuring memory IP core pin capacitance, such as figure 1 As shown, the method includes:
[0052] S11. Extract the RC netlist of each sub-module included in the memory IP core.
[0053] S12. Merge the RC netlist of each submodule into a first RC netlist according to the stitching rule of t...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 


