A test method for linear sensors

A linear sensor and testing method technology, applied in electronic circuit testing, instruments, measuring electricity and other directions, can solve the problems of cumbersome testing and low accuracy, and achieve the effect of improving testing convenience and testing accuracy.

Active Publication Date: 2019-05-31
深圳市海纳微传感器技术有限公司
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  • Abstract
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Problems solved by technology

[0004] The technical problem to be solved by the present invention is the technical problem of cumbersome testing and low precision in the prior art

Method used

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  • A test method for linear sensors
  • A test method for linear sensors

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Embodiment 1

[0039] This embodiment provides a test system for linear sensors, such as figure 1 As shown, the test system includes a linear sensor to be tested, an AMP operational amplifier, an ADC conversion module connected with the AMP operational amplifier, an FPGA connected with the ADC conversion module, an A380 image processor connected with the FPGA, and an A380 image processor connected with the A380 image processor connected host computer; the FPGA is also connected to the light source module; the AMP operational amplifier is used to amplify the analog output signal of the linear sensor to be measured; the ADC conversion module is used to convert the amplified signal output by the AMP to 12Bit; the FPGA uses It is used to preprocess the 12Bit data; the A380 image processor is used to transmit the preprocessed 8Bit data; the host computer is used to test the image quality; the light source module is used to output the light source.

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Abstract

The invention relates to a test method applied to a linear sensor. The technical problems of complex test process and low test precision in the prior art are solved. According to the invention, the test system comprises the linear sensor to be tested, an AMP operational amplifier, an ADC conversion module which is connected with the AMP operational amplifier, an FPGA which is connected with the ADC conversion module, an A380 image processor which is connected with the FPGA, and a host computer which is connected with the A380 image processor; the FPGA is connected with a light source module; the test method comprises the steps of illumination setting, parameter presetting, data preprocessing and data reversing; various poor technical schemes are judged; the problems are well solved; and the test method can be used in the industrial production of linear sensors.

Description

technical field [0001] The invention relates to the field of image sensor testing in the field of semiconductors, in particular to a testing method for linear sensors. Background technique [0002] Since the linear sensor is an image acquisition sensor, each chip must undergo a final test before leaving the factory. All relevant defective products must be screened out, and the defective products must be classified and counted. Through the defective type, it is possible to locate which chips belong to the fab The problem, which belongs to the problem of the packaging factory, and even further locates whether there are defects in the design of its own circuit. [0003] The existing use method adopts manual testing, which has the technical problems of low test accuracy and complex use methods. Therefore, it is necessary to provide a testing system for linear sensors that is convenient for testing and has high testing accuracy. The system collects images through the hardware p...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/2825G01R31/2837
Inventor 不公告发明人
Owner 深圳市海纳微传感器技术有限公司
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