Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Surface defect detection method of robust based on machine vision

A technology of machine vision and defect detection, applied in the field of image processing, to achieve the effect of convenient application

Active Publication Date: 2017-07-04
北京海风智能科技有限责任公司
View PDF3 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Aiming at the problem that the existing binarization detection algorithm can only target one detection object surface, such as fabric, metal and glass, etc.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Surface defect detection method of robust based on machine vision
  • Surface defect detection method of robust based on machine vision
  • Surface defect detection method of robust based on machine vision

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0033] In this embodiment, the circular defect detection on the metal surface is taken as an example for illustration, and the process is as follows figure 1 As shown, the specific implementation of the detection steps:

[0034] Step 1: Grayscale processing. The image of the surface to be detected is collected by the camera. If it is a color image, it is grayscaled first to obtain a grayscale image I. The grayscale image I is as follows: figure 2 shown.

[0035] Step 2: Invert the image. If the gray value of the damage is higher than the background value, the gray image I is inverted.

[0036] Step 3: Threshold initialization. Initialize the binarization threshold t, and calculate the probability statistics value P of the image 0 (t).

[0037]

[0038] Among them, p i is the probability of gray value i, p i =n i / N, where ni is the number of pixels with gray value i in the image, and N is the number of pixels in the entire image.

[0039] Step 4: Calculate the av...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a surface defect detection method of robust based on machine vision. The method comprises the following steps: 1) performing gray-scale treatment on the input colorful images to obtain a grey-scale image; 2) when the damage gray value in the grey-scale image is higher than that of the background, inverting the color of the gray-scale image; 3) based on the provided binarizition threshold optimization function, calculating the optimal threshold value; 4) based on the optimal threshold value, performing binaryzation on the image; and 5) performing contour detection on the image after binarizition. According to the provided method for calculating the optimal threshold value by the binarizition threshold optimization function, compared with the traditional binaryzation operation such as an iterative threshold method, an otsu method, a bimodal average method and an one-dimensional maximum entropy method, the method has strong robustness, damage position can be accurately extracted from the image containing the surface defect, and the proportion of the non damaged image with false detection as damaged is greatly reduced. The parameter can be conveniently adjusted, and the realization process is simple.

Description

[0001] technology neighborhood [0002] The invention belongs to the field of image processing and relates to a robust machine vision-based surface defect detection method. Background technique [0003] At present, due to the popularization of machine vision, surface defect detection methods based on machine vision are very extensive. In the field of computer vision and image processing, image binarization processing method is one of the most basic and important research contents of image analysis and recognition. , the general surface defect detection method based on machine vision is to detect the image through binarization. At present, there are many image binarization methods, but the detection effect is often poor. Lack of robustness, often only for one detection object surface, such as fabric, metal and glass and so on. Conventional binarization algorithms often have a high false detection rate, and damages are often detected incorrectly in images that do not contain d...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/95G06T7/00
CPCG01N21/95G06T7/0004
Inventor 龙海生常雪松
Owner 北京海风智能科技有限责任公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products