Quick release ic test socket for turret test device

Abstract

The invention relates to a turret type test device fast disassembling IC test base. The turret type test device fast disassembling IC test base comprises a pedestal, an IC interface board to be tested, a test base, an adapter base and multiple radio frequency signal lines. The fast disassembling IC test base can be connected with more radio frequency signal lines, can avoid mutual interference and winding of the radio frequency signal lines and can be fast and simply disassembled and assembled in the turret type test device without generating the problems of false connection and damage of the radio frequency signal lines.

Description

technical field

[0001] The present invention relates to a quick-release IC test socket of a turret-type test device, in particular to a quick-release IC test socket of a turret-type test device for high-frequency testing. Background technique

[0002] With the advancement and generalization of wireless communication technology, and the demand for IC size reduction and multi-function, the IC structure gradually adopts the design of small chips with multiple radio frequency functions, which means that a single IC chip no longer only has a single radio frequency (RF) Function, but with a variety of radio frequency functions, and the size of the IC is more reduced. After the production of these ICs with multiple radio frequency functions is completed, it is often necessary to perform various radio frequency tests on the IC to confirm the various radio frequency functions of the IC. Because such ICs are small in size, in order to increase the efficiency of testing, turret testin...

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