Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

System, index optimization method and index optimization device

An index optimization and index technology, applied in the field of data processing, can solve problems such as difficult engineering implementation, performance improvement, multi-system resources, etc., and achieve the effects of avoiding random jitter of system performance, improving efficiency, and improving large system performance

Active Publication Date: 2017-10-24
ADVANCED NEW TECH CO LTD
View PDF8 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, the inventors of the present application found that the above method needs to traverse each new index in the new index set one by one, which is very time-consuming
At the same time, if the existing system is already relatively complex, adding a single indicator may not actually bring actual performance improvement to the system
Sometimes, the jitter of system performance may even be caused by the selection of random parameters. Therefore, in general, it is often necessary to add a set of indicators at the same time to see the actual effect.
According to the existing technology, the traversal complexity of selecting a set of indicators from a new indicator set is exponential, which will occupy too many system resources, and it is almost difficult to implement in engineering

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • System, index optimization method and index optimization device
  • System, index optimization method and index optimization device
  • System, index optimization method and index optimization device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] In order to make the objectives, technical solutions, and advantages of the embodiments of the present application clearer, the following describes the embodiments of the present application in further detail with reference to the embodiments and drawings. Here, the illustrative embodiments of the embodiments of the present application and their descriptions are used to explain the embodiments of the present application, but are not intended to limit the embodiments of the present application.

[0026] The specific implementation of the embodiments of the present application will be further described in detail below in conjunction with the accompanying drawings.

[0027] reference figure 1 As shown, the system index optimization method of the embodiment of the present application includes the following steps:

[0028] Step S101: Obtain all the used index parameters and their values ​​of the system, and all the index parameters and their values ​​to be selected.

[0029] In the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a system, an index optimization method and an index optimization device. The method comprises steps: all already-used index parameters and numerical values thereof of the system, and all to-be-selected index parameters and numerical values thereof are acquired; based on a preset data dimension reduction algorithm, dimension reduction processing is carried out on all already-used index parameters and the numerical values thereof, and a corresponding feature parameter set and the numerical values thereof are acquired; with the numerical values of the feature parameter set as input and the numerical values of all to-be-selected index parameters as target output, a preset machine learning model is trained, and prediction values of the numerical values of all to-be-selected index parameters are acquired; a difference measurement value between the numerical value of each of the all to-be-selected index parameters and a corresponding prediction value is acquired; and a preset number of to-be-selected indexes with the maximum difference measurement values are selected as newly-added indexes of the system. The index optimization efficiency can be improved, and system performance jitter is reduced.

Description

Technical field [0001] This application relates to the field of data processing technology, and in particular to a system and its index optimization method and device. Background technique [0002] As time goes by, in the actual application process of some systems, the relevant statistical information is continuously accumulated and enriched. Through the analysis and processing of the statistical information, it may be found that new indicators need to be added and the system reconstructed on this basis To improve its performance. [0003] With the continuous development and change of computer networks and information technology, there are currently some systems that have the function of automatically constructing new index sets. These new index sets can help the system adapt to new changes, thereby helping to improve system performance. However, because the number of new indicators in the new indicator set is usually large, and some of the systems (such as online systems) have li...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/62
CPCG06F18/213G06F18/217
Inventor 刘毅捷
Owner ADVANCED NEW TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products