Interval adjusting device used for detecting probes

Abstract

Provides an interval adjustment device for detecting probes, including a base and a side mounting plate vertically connected to one side of the upper plane of the base, bearing fixing seats are provided on both sides of the side mounting plate, and the bearing fixing seats are vertical to the side mounting plate Slidingly connected and driven by the vertical fine-tuning device to slide up and down along the side mounting plate, the two ends of the horizontal screw shaft are rotatably supported on the bearing fixing seat, and the horizontal screw shaft is respectively connected by left-handed and right-handed threads. The adjustment spacing plate is connected with the side mounting plate through a guide sliding structure. One end of the horizontal screw shaft is provided with a horizontal fine-tuning device that drives the two adjustment spacing plates to move in opposite directions along the guide sliding structure. The two adjustment Probe fixing plates are arranged on opposite sides of the spacing plate. The invention can adjust the interval between the probes installed on it and the upper and lower positions, realize the detection of electronic devices with various pin specifications, the adjustment is fast and accurate, the manufacturing cost is low, and the work efficiency is improved.

Description

technical field [0001] The invention belongs to the technical field of detection auxiliary devices, and in particular relates to an interval adjustment device for detection probes. Background technique [0002] The probe is a contact medium for electrical testing. It is a high-end precision electronic device, such as a switch electrical appliance. For electrical components with the same specifications, the coil pin spacing specifications are different. This requires processing a variety of probe detection structures. The cost is high, the management and storage are unchanged, the detection is time-consuming and laborious, and the work efficiency is low. Therefore it is necessary to propose improvements. Contents of the invention [0003] The technical problem solved by the present invention is to provide an interval adjustment device for detecting probes. The present invention can adjust the interval between the probes installed on it and the upper and lower positions, so...

AI Technical Summary

Problems solved by technology

[0002] The probe is a contact medium for electrical testing. It is a high-end precision electronic device, such as a switch electrical appliance. For the same type of electrical components, the coil pin spacing specifications are different, which requires processing a variety of probe detection structures, high cost, unchanged management and storage, time-consuming and laborious detection, and low work efficiency

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