Unlock instant, AI-driven research and patent intelligence for your innovation.

Multi-fault-tolerant mds array code encoding and repair method

A technology of coding method and repair method, applied in code conversion, data representation error detection/correction, input/output process of data processing, etc. The effect of repairing broadband, improving fault tolerance, and low computational complexity

Active Publication Date: 2019-11-22
紫晟科技(深圳)有限公司
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] In order to solve the problems in the prior art, the present invention provides a multi-fault-tolerant MDS array code encoding and repair method, which solves the problem that the prior art cannot have both optimal repair and higher fault tolerance

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multi-fault-tolerant mds array code encoding and repair method
  • Multi-fault-tolerant mds array code encoding and repair method
  • Multi-fault-tolerant mds array code encoding and repair method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0017] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0018] Acronyms and key term definitions

[0019] MDS Maximum Distance Separable The maximum distance can be separated

[0020] RDP Row-Diagonal Parity row diagonal check

[0021] A multi-error-tolerant MDS array code encoding, its component is C(k, 3, p) code, which divides the data block into k(p-1)τ information bits and encodes them to generate 3(p-1)τ redundant The remainder, (p-1)τ is a positive integer, τ=2 k-2 , p is a prime number, k≥3, and the information bit is expressed as Redundant bits are expressed as Where j is k+1, k+2 and k+3, i=1, 2, ..., k; each (p-1) τ information bit is appended with τ extra bits and forms a message vector.

[0022] The information column is represented by a polynomial, and each corresponding information column is a data polynomial, and the corresponding three parity columns form a coded polynomial, ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention relates to the field of data processing, and provides a multi-fault tolerance MDS array code encoding, a component thereof being a C(k,3,p) code, expressing data blocks as k(p-1)τ information bits and encoding to generate 3(p-1)τ redundant bits, (p-1)τ being a positive integer, τ=2k-2, p being a prime number, k≥3, τ extra bits being added to each (p-1)τ information bit to form a message vector. The advantageous effects of the present invention are: the fault tolerance of a system is improved; the calculation complexity of encoding and decoding is relatively low, and a repair bandwidth is thereby significantly reduced.

Description

【Technical field】 [0001] The invention relates to the field of data processing, in particular to a multi-error-tolerant MDS array code encoding and repair method. 【Background technique】 [0002] Modern distributed storage systems utilize erasure codes to maintain data availability to avoid failure of storage nodes. Binary maximally distance separable (MDS) array codes are a special kind of erasure codes that achieve fault tolerance with minimal storage redundancy and low computational complexity. Specifically, the binary array code is composed of an array of k+r columns, and each column has L bits. For the k+r columns, the information columns of k columns store information bits, and the parity columns of r columns store redundant bits. Surplus. The L bits in each column are stored in the same storage node. If any k in k+r columns is sufficient to reconstruct all k columns of information, then such a code can be called MDS (ie it can tolerate failure of any r columns). Ex...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H03M7/04H03M13/03H04L29/08G06F3/06
CPCG06F3/0614G06F3/067H03M7/04H03M13/03H04L67/1097
Inventor 侯韩旭李柏晴韩永祥
Owner 紫晟科技(深圳)有限公司
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More