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A digital chip fault detection system and its detection method

A digital chip and fault detection technology, which is applied in digital circuit testing, electrical measurement, short-circuit testing, etc., can solve the problems of low reliability of test results, complex wiring of digital chip fault detection, time-consuming and labor-intensive problems, and achieve time-consuming fault detection. Short, save device cost, avoid the effects of wiring operations

Active Publication Date: 2020-06-16
上海新橘科技有限公司
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  • Description
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  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to overcome the deficiencies in the prior art, provide a digital chip fault detection system, and solve the technical problems in the prior art that the digital chip fault detection wiring is complicated, the reliability of the detection result is not high, and time-consuming and labor-intensive

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  • A digital chip fault detection system and its detection method
  • A digital chip fault detection system and its detection method
  • A digital chip fault detection system and its detection method

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Embodiment Construction

[0045] The digital chip fault detection system provided by the invention includes a single-chip microcomputer and a power supply module.

[0046] The VDD pin of the digital chip to be tested is connected to the +5V pin and GND pin of the power supply module through the first relay module, and the GND pin of the digital chip to be tested is connected to the +5V pin and GND pin of the power supply module through the second relay module pin connection. Each input pin of the digital chip to be tested is connected to the +5V pin and the GND pin of the power supply module through the first analog selection switch, and each output pin of the digital chip to be tested is connected to the +5V pin of the power supply module through the second analog selection switch. pin and GND pin connection. The first relay module, the second relay module, the first analog selection switch, and the second analog selection switch are respectively connected to corresponding pins of the single-chip mic...

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Abstract

The invention discloses a digital chip fault detection system. A VDD pin and a GND pin of a digital chip to be detected are connected to a +5V pin and a GND pin of a power supply module through a relay module. Each input pin and each output pin are connected to the +5V pin and the GND pin of the power supply module through an analog selection switch. A single chip micromputer allows any pin of the digital chip to be detected to be connected to any specified position in a +5V power supply and a GND end through controlling a relay module and the analog selection switch. The invention also discloses a digital chip fault detection method, through the magnitude of current which pass the VDD pin and the GDN pin, short circuit and open circuit faults are judged, and whether the digital chip to be detected has a logic function fault is judged according to the logic output of the digital chip to be detected. The detection speed is fast, the detection cost is low, and a detection result is reliable.

Description

technical field [0001] The invention relates to a digital chip fault detection system and a detection method thereof. Background technique [0002] The 74 series digital chips represented by 74HC00 and 74HC32 are widely used in digital circuit experiment courses in colleges and universities. In the daily teaching process, due to the long service life of digital chips, high reuse rate, and irregular operation of students, digital chips will inevitably have various failures. If students use faulty chips, it will seriously affect their course effectiveness and learning progress. Therefore, teachers of experimental courses should eliminate faulty chips before class. [0003] The traditional chip fault detection method is manual detection: inspectors check the function of each logic gate of the chip under test sequentially against the logic truth table of the digital chip. However, this method is not only complicated to connect, time-consuming and labor-intensive, but also has...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/3177G01R31/317G01R31/52G01R31/54
CPCG01R31/31703G01R31/31718G01R31/3177G01R31/50
Inventor 华国环费敬敬
Owner 上海新橘科技有限公司
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