Method and system for testing data integrity of storage device
A data integrity and storage device technology, applied in static memory, instruments, etc., can solve the problems of low accuracy of test results, time-consuming and labor-intensive, etc., and achieve batch testing, simple testing process, high testing efficiency and accuracy Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Example Embodiment
[0036] In order to make the objectives, technical solutions and advantages of the present invention clearer, the following further describes the present invention in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.
[0037] figure 1 Shows the implementation flowchart of the storage device data integrity testing method provided by the present invention, which specifically includes the following steps:
[0038] In step S101, control to establish an interactive communication channel between the test host and the storage device.
[0039] In step S102, the test data source write instruction is executed on the test host, and the test data source is controlled to be written in advance on the storage device.
[0040] In the step, in the process of writing the test data source, the content of the written test data sour...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap