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Method and system for testing data integrity of storage device

A data integrity and storage device technology, applied in static memory, instruments, etc., can solve the problems of low accuracy of test results, time-consuming and labor-intensive, etc., and achieve batch testing, simple testing process, high testing efficiency and accuracy Effect

Active Publication Date: 2017-12-08
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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Problems solved by technology

[0004] The purpose of the present invention is to provide a method for testing the data integrity of storage devices, aiming to solve the problem of verifying the integrity of storage data in storage devices in the prior art, generally by checking the code or checking the plug-in installation package commands, but these verifications The method is time-consuming and labor-intensive, and the test results are less accurate

Method used

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  • Method and system for testing data integrity of storage device
  • Method and system for testing data integrity of storage device

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Embodiment Construction

[0036] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0037] figure 1 It shows the implementation flow chart of the testing method for the data integrity of the storage device provided by the present invention, which specifically includes the following steps:

[0038] In step S101, the control establishes an interactive communication channel between the test host and the storage device.

[0039] In step S102, a test data source write instruction is executed on the test host side, and the test data source is pre-written on the storage device under control.

[0040] In the step, in the process of writing the test data source, the content of the test d...

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Abstract

The invention relates to the technical field of testing of a storage device, and provides a method and a system for testing the data integrity of the storage device. The method comprises the following steps: controlling to establish an interactive communication channel between a testing host end and the storage device; executing a testing data source write command on the testing host end, and controlling to pre-write a testing data source in the storage device; when a testing data source write action is judged to be completed, carrying out system destruction on the storage device, and executing a system recovery action; when system recovery is completed, executing a testing data source verification command on the testing host end, and controlling to read the testing data source of which data is pre-written on the storage device; judging whether the read testing data source is matched with the pre-written testing data source or not, and determining that the testing is passed if so, thus realizing verification testing on the integrity of stored data of the storage device. A testing process is simple, the testing efficiency and the accuracy are higher, convenience is provided for testing users, and batch testing is convenient.

Description

technical field [0001] The invention belongs to the technical field of storage device testing, in particular to a method and system for testing data integrity of a storage device. Background technique [0002] In the test process of reading and writing data on the storage device, in order to verify whether the data read and written in the storage device is lost and whether the data is complete, it is necessary to verify the data in the storage device that has been read and written. Verify whether data is lost, thereby verifying the performance of the storage device. During the testing process, customer source data is relatively important data. Once the data on the storage side is lost, it will cause immeasurable economic losses to the customer, and when the source data in the storage device is lost, it will cause serious losses to the customer (such as industries such as finance, government and hospitals), which will have a bad impact on the quality of storage products. ...

Claims

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Application Information

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IPC IPC(8): G11C29/56
CPCG11C29/56
Inventor 邢鹏飞
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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