Method and device for extracting image features based on semi-supervised learning
A semi-supervised learning and image feature technology, applied in the direction of instruments, character and pattern recognition, computer components, etc., can solve the problems of labor-intensive and time-consuming, and cannot quickly solve the problem of external test data mapping
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[0051] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0052] In order to enable those skilled in the art to better understand the solution of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0053] Next, a method for extracting image features based on semi-supervised learning provided by an embodiment of the present invention is introduced in detail. figure 1 A flow chart of a method for...
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