A life test method and device for a solid-state hard disk

Abstract

The application discloses a life testing method and device of a solid state drive (SSD). The method and device are used for improving testing efficiency, verifying whether a main control chip of the solid state drive supports a static Wear-Leveling (WL) algorithm, and enabling a testing result to be more accurate. The life testing method of the solid state drive provided by the application includes: respectively writing cold data and hot data into the to-be-tested solid state drive, and storing the cold data into another piece of equipment for backing-up; continuously writing the hot data intothe solid state drive, and recording writing frequency of the hot data; and according to the writing frequency of the hot data and a preset cycle, judging, by comparing, whether cold data in the solid state drive are identical to cold data backed up, if yes, continuing to continuously write the hot data into the solid state drive, and otherwise, ending testing.

Description

technical field [0001] The present application relates to the field of electronic technology, in particular to a method and device for testing the life of a solid-state hard disk. Background technique [0002] At present, the technology of Solid State Drives (SSD) has advanced by leaps and bounds, especially in terms of lifespan, which has reached a range acceptable to consumer users. However, for enterprise users, although SSD has no mechanical parts and has better stability, the problem of lifespan still worries many enterprises. Therefore, it is necessary to have corresponding life testing technology to determine whether the life of SSD can meet the needs of enterprises. [0003] Compared with traditional mechanical hard disk drives (Hard Disk Drives, HDD), SSDs based on flash memory (NAND Flash) have the advantages of fast speed, small size, low power consumption, and no noise, so they are favored by major enterprises and consumers. However, NAND Flash is essentially a...

AI Technical Summary

Problems solved by technology

[0011] To sum up, in the prior art, the method of large-scale data writing is slow, and each P / E process needs to erase the data in all blocks before writing; the existing large-scale data writing test SSD The lifespan method cannot effectively test whether the SSD main control supports the static Wear-Leveling algorithm; the existing method of testing the SSD lifespan does not consider the state of cold data storage, and ignores the impact of write amplification on the lifespan of the SSD during actual use. Truly and effectively reflect the SSD life in actual use

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