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A parameter processing method and system

A technology of parameters and parameter sets, applied in the field of communication, can solve problems such as abnormal radio frequency measurement, heavy workload, repeated operations, etc., and achieve the effects of reducing development times, improving stability, and reducing operations

Active Publication Date: 2021-06-11
DATANG LINKTESTER TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The present invention provides a parameter processing method and system to solve the problem of abnormal radio frequency measurement caused by the frequent operation of storing and loading parameters in the existing terminal comprehensive testing instrument when testing the terminal, and the storage of parameters , The problems of heavy workload, repeated operations, and redundancy in the development process of the loading function

Method used

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  • A parameter processing method and system
  • A parameter processing method and system
  • A parameter processing method and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0066] refer to figure 1 , shows a flow chart of steps of a parameter processing method in Embodiment 1 of the present invention. In this embodiment, the parameter processing method includes:

[0067] Step 102, matching the first parameter with a sample set, and obtaining first attribute information corresponding to the first parameter from the sample set.

[0068] In this embodiment, the sample set may include corresponding general attribute information of various types of sample parameters, such as: default values, valid ranges, types, whether to store, and other information of sample parameters. By matching the first parameter with the sample set, the first attribute information corresponding to the first parameter can be obtained from the sample set.

[0069] Step 104, storing the first parameter in a first setting location according to the first attribute information.

[0070] In this embodiment, after the first attribute corresponding to the first parameter is determi...

Embodiment 2

[0078] refer to figure 2 , shows a flowchart of steps of a parameter processing method in Embodiment 2 of the present invention. In this embodiment, the parameter processing method includes:

[0079] Step 202, acquire sample parameters.

[0080] In this embodiment, parameters of respective types may be obtained as the sample parameters in any appropriate manner. Wherein, corresponding parameters may be selected as the sample parameters according to test requirements or requirements of other actual environments. The sample parameters are one or more.

[0081] Step 204, define the sample parameters, set attribute information of the sample parameters, and obtain the sample parameter set.

[0082] In this embodiment, the set attribute information of the sample parameter includes but is not limited to at least one of the following information: the default value of the sample parameter, the effective range, the type, and the The first indication information, the second indicat...

Embodiment 3

[0121] In combination with the foregoing embodiments, this embodiment describes the parameter processing method in detail through a specific example.

[0122] refer to image 3 , shows a structure diagram of a system for implementing the parameter processing method in Embodiment 3 of the present invention. In this embodiment, the system for implementing the parameter processing method may include: a parameter storage and loading interface, a general parameter storage component, a general parameter loading component, and a parameter definition component. Wherein, the parameter storage and loading interface may be located at the UI layer, the parameter general storage component and parameter general loading component may be located at the logic layer, and the parameter definition component may be located at the business layer. The parameter storage and loading interface can be used to receive user storage and loading requests for parameters, the parameter general storage compon...

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Abstract

The present invention provides a parameter processing method and system, wherein the method includes: matching a first parameter with a sample set, and acquiring first attribute information corresponding to the first parameter from the sample set; according to the The first attribute information stores the first parameter in a first setting location; receives a parameter loading request; obtains and loads the parameter requested by the parameter loading request from the first setting location. The present invention solves the problem of abnormal radio frequency measurement caused by the frequent operation of parameter storage and loading in the existing terminal comprehensive tester when testing the terminal, and the problems existing in the development process of parameter storage and loading functions Problems of heavy workload, repetitive operations, and redundancy.

Description

technical field [0001] The present invention relates to the field of communication technology, in particular to a parameter processing method and system. Background technique [0002] The terminal comprehensive tester can be widely used in the calibration and testing of terminal production, as well as in the fields of terminal and chip R&D and design, and can also be used in the certification test of terminal radio frequency consistency. The terminal comprehensive tester can test multiple fields of the terminal, and the corresponding functions it supports are also very rich. [0003] When the terminal comprehensive tester tests the terminal, the user needs to configure corresponding parameters for each test function, so as to realize the test of different scenarios and conditions of the terminal. Usually, every time a new parameter definition is added, developers need to develop the storage and loading functions of this parameter. Frequent operations on parameter storage an...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04B17/00H04M1/24
CPCH04B17/00H04M1/24
Inventor 王福
Owner DATANG LINKTESTER TECH