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Workpiece contour scanning system and method thereof

A workpiece contour and scanning system technology, applied in the field of workpiece contour scanning system, can solve the problems of wasting manpower and material resources, insecurity, etc., and achieve the effect of saving manpower and material resources

Inactive Publication Date: 2018-03-23
北京颐和海纳科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] The existing detection of the contour of the workpiece needs to scan the contour, but for the scanning of the contour of a large workpiece, manual scanning is required
However, manual scanning of large workpieces requires ladders, etc., which wastes manpower and material resources, and there are still unsafe factors

Method used

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  • Workpiece contour scanning system and method thereof
  • Workpiece contour scanning system and method thereof
  • Workpiece contour scanning system and method thereof

Examples

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Effect test

no. 1 example

[0026] The first embodiment of the present invention provides a workpiece contour scanning system 100, please refer to figure 1 , the workpiece contour scanning system 100 includes a moving device 110 , a scanning device 120 , a positioning device 130 and a control device 140 . Wherein, the scanning device 120 and the positioning device 130 are both disposed on the mobile device 110 . See figure 2 , the control device 140 is respectively connected to the mobile device 110 , the scanning device 120 and the positioning device 130 .

[0027] In the embodiment of the present invention, the positioning device 130 is used to obtain the location information of the mobile device 110 and transmit it to the control device 140; the control device 140 is used to control the mobile device 110 to drive the scanning device 120 to move based on the location information and the preset movement path, and Control the mobile device 110 to adjust the three-dimensional posture of the scanning de...

no. 2 example

[0058] The second embodiment of the present invention provides a workpiece contour scanning method, which is applied to the workpiece contour scanning system provided by the first embodiment of the present invention. See Figure 4 , the workpiece contour scanning method includes:

[0059] Step S110: the positioning device acquires location information of the mobile device, and transmits the location information to the control device.

[0060] Step S120: The control device controls the moving device to drive the scanning device to move based on the position information and the preset moving path, and controls the moving device to adjust the three-dimensional posture of the scanning device relative to the workpiece to be measured.

[0061] Step S130: Driven by the moving device, the scanning device acquires contour data of the entire outer surface area of ​​the workpiece to be measured, and transmits the contour data to the control device.

[0062] Step S140: the control devic...

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Abstract

An embodiment of the invention provides a workpiece contour scanning system and a method thereof, wherein the system and the method relate to the field of workpiece scanning. The workpiece contour scanning system comprises a moving device, a scanning device, a positioning device and a control device. The scanning device and the positioning device are arranged on the moving device. The control device is connected with the moving device, the scanning device and the positioning device, wherein the positioning device is used for acquiring position information of the moving device and transmittingto the control device. The control device is used for making the moving device drive the scanning device to move based on the position information and a preset moving path, and furthermore makes the moving device adjust the three-dimensional attitude of the scanning device relative to a to-be-tested workpiece. The scanning device is used for acquiring the contour data of the whole appearance areaof the to-be-tested workpiece through driving by the moving device and transmits the contour data to the control device. The control device is also used for generating the contour of the to-be-testedworkpiece based on the contour data. The workpiece contour scanning system and the method thereof can realize automatic scanning and acquisition for the contour of the workpiece.

Description

technical field [0001] The present invention relates to the field, in particular, to a workpiece contour scanning system and method. Background technique [0002] Existing detection of the contour of a workpiece requires scanning the contour, but for scanning the contour of a large workpiece, manual scanning is required. However, manual scanning of large workpieces requires ladders, which wastes manpower and material resources, and there are still unsafe factors. Contents of the invention [0003] In view of this, the present invention provides a workpiece contour scanning system and method to improve the above problems. [0004] To achieve the above object, the present invention provides the following technical solutions: [0005] In the first aspect, an embodiment of the present invention provides a workpiece contour scanning system. The workpiece contour scanning system includes a moving device, a scanning device, a positioning device, and a control device. Both the s...

Claims

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Application Information

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IPC IPC(8): G01B21/20G01B11/24
CPCG01B11/24G01B21/20
Inventor 盖玉收
Owner 北京颐和海纳科技有限公司
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