Wiener process reliability analyzing method considering self-correlated measurement errors

A technology of measurement error and analysis method, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve the problems of non-negligible autocorrelation, affecting reliability analysis accuracy, affecting reliability evaluation accuracy, etc., to improve Evaluate the effect of estimating, improving the accuracy of reliability assessment

Active Publication Date: 2018-03-30
HENAN UNIV OF SCI & TECH
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Problems solved by technology

[0004] However, in all current degradation models considering measurement errors, it is assumed that the measurement errors at different times are independent of each other and obey the same normal distribution
However, this is inconsistent with many actual situations, especially when the test time interval is short, the autocorrelation between continuous test measurement errors is often not negligible, and the independence assumption will seriously affect the accuracy of reliability analysis
In engineering practice, the measurement errors in performance degradation data usually have autocorrelation, and sometimes cannot be ignored. However, the existing performance degradation analysis methods all assume that the measurement errors between different test times are independent of each other and obey the same normal distribution, which can seriously affect the reliability assessment accuracy, especially when the test interval is short

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Embodiment Construction

[0056] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0057] Such as figure 1 As shown, a Wiener process reliability analysis method considering autocorrelation measurement error, the steps are as follows:

[0058] Step 1: Randomly select m samples from a batch of products and put them into the test to collect product performance degradation data.

[0059] Assuming that m samples are randomly selected from a batch of products and put into the test, for the i-th sample, the n i test time Perform performance de...

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Abstract

The invention provides a Wiener process reliability analyzing method considering self-correlated measurement errors. The problem that an existing performance degradation analyzing method severely influences reliability evaluating precision is solved. The method includes the steps of randomly extracting a sample from a batch of products to be put in a test, collecting product performance degradation data, describing the real performance degradation process of the products according to the Wiener process, establishing a Wiener process performance degradation model considering the self-correlatedmeasurement errors, estimating unknown parameters of the performance degradation model through a likelihood function, and analyzing the product reliability according to the estimated unknown parameters. The method is a degradation reliability analyzing method of a linear Wiener process of the AR (1) measurement errors, the evaluating precision is effectively improved, universality is achieved, adaptability is higher, a reliability function analyzing expression under a given degradation failure threshold is given, and the basis is provided for subsequent reliability evaluation of the products.

Description

technical field [0001] The invention relates to the technical field of small sample reliability analysis, relates to a reliability analysis method based on performance degradation data, in particular to a Wiener process reliability analysis method considering autocorrelation measurement error. Background technique [0002] In aerospace, weaponry and other fields, the characteristics of small samples, high reliability and long life of products have become increasingly prominent, which has brought great challenges to traditional reliability analysis methods based on failure time. Performance degradation modeling is one of the key technologies to solve the reliability analysis of such products, and it is also a hot and difficult point in the field of reliability engineering research. [0003] Considering that the performance degradation process of products is often affected by many random factors at the same time, degradation modeling based on stochastic process theory is the f...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCG06F30/20
Inventor 李军星杨晓英张志文吕锋
Owner HENAN UNIV OF SCI & TECH
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