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A method and device for instant inspection of aerial photography flight quality

A flight quality, aerial photography technology, applied in the field of aerial photography, can solve the problems of low efficiency, high cost, low inspection accuracy, etc.

Active Publication Date: 2020-10-30
AERIAL PHOTOGRAMMETRY & REMOTE SENSING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, no matter whether it is quality inspection through aerial photography or POS data, there are problems such as low efficiency, low inspection accuracy, and high cost. Therefore, the existing technology has low efficiency, low inspection accuracy, and high cost. question

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  • A method and device for instant inspection of aerial photography flight quality
  • A method and device for instant inspection of aerial photography flight quality
  • A method and device for instant inspection of aerial photography flight quality

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Embodiment Construction

[0023] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention. Accordingly, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary sk...

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Abstract

A method and device for instant inspection of aerial photography flight quality provided by the embodiments of the present invention belong to the technical field of aerial photography. By obtaining the elevation of the preset exposure point, the flight control information and the camera parameters of the camera used to capture this aerial photography, the overlapping degree is calculated using the acquired elevation of the exposure point, the flight control information and the camera parameters And yaw angle, and then judge the flight quality through the calculated inspection items such as photo overlap and yaw angle. The elevation value of the photo field is effectively used, the detection accuracy is further improved, the efficiency is improved and the cost is saved.

Description

technical field [0001] The invention relates to the technical field of aerial photography, in particular to a method and device for instant inspection of flight quality of aerial photography. Background technique [0002] There are currently two types of aerial photography quality inspection methods, one is to use aerial photography (browser) for quality inspection; the other is to use POS data for quality inspection. However, no matter whether it is quality inspection through aerial photography or POS data, there are problems such as low efficiency, low inspection accuracy, and high cost. Therefore, the existing technology has low efficiency, low inspection accuracy, and high cost. question. Contents of the invention [0003] The present invention provides a method and device for instant inspection of aerial photography flight quality, aiming to improve the above problems. [0004] The present invention provides a method for instant inspection of aerial photography flig...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01C11/04
CPCG01C11/04
Inventor 胡曼吕军超赵欢郝伟姣王亮亮
Owner AERIAL PHOTOGRAMMETRY & REMOTE SENSING CO LTD
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