Fault testing method and system for a photoelectric theodolite
A photoelectric theodolite and fault testing technology, applied in instruments, measuring devices, etc., can solve problems such as blank, inability to learn fault information, and difficulty in fault extension maintenance and fault diagnosis, and achieve the effect of reducing difficulty.
Active Publication Date: 2021-10-08
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology
[0004] In the prior art, the fault testing technology of the photoelectric theodolite is basically blank. Only when the photoelectric theodolite automatically alarms the failure of each extension, the technician can learn which extension of the photoelectric theodolite breaks down, but because the photoelectric theodolite can only show which When an extension fails, more detailed fault information cannot be obtained, which makes it more difficult for technicians to repair and diagnose the faulty extension
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[0034] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0035] The embodiment of the present application provides a fault testing method of a photoelectric theodolite, such as figure 1 Shown, realize based on photoelectric theodolite fault test system, described photoelectric theodolite fault test system comprises test interface, test adapter and test platform connected successively, and described test interface comprises resistance identification pin, communication pin, analog signal pin and Digital signal pin, th...
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The application discloses a fault testing method and system of a photoelectric theodolite, wherein, the fault testing method of the photoelectric theodolite is realized based on a fault detection system of the photoelectric theodolite with a unified test interface, and first reads the fault of the photoelectric theodolite by the extension to be tested through the test adapter. The test signal set of the extension to be tested is composed of the test signals of each component of the test signal set, and then the test signal of each component in the test signal set is compared with the expected signal of each component to determine the abnormal components in each of the extensions to be tested. The purpose of the fault diagnosis of each component of the photoelectric theodolite to be tested is to reduce the granularity of the fault diagnosis to each component that constitutes the to-be-tested extension, so that technicians can perform maintenance and specific fault diagnosis on the failed components, reducing the cost of the photoelectric theodolite. Difficulty of maintenance and troubleshooting.
Description
technical field [0001] The present application relates to the technical field of photoelectric theodolite, and more specifically, relates to a fault testing method and system of a photoelectric theodolite. Background technique [0002] The photoelectric theodolite is a large-scale optical measurement device used by modern shooting ranges to test external ballistic data and flight status. [0003] The photoelectric theodolite is mainly composed of optical system (telescope), tracking servo system (tracking TV, tracking frame, servo controller and electric control), angle measuring system (azimuth and elevation encoder), recording system, etc. The device is also called the extension of the photoelectric theodolite. With the improvement of the performance and complexity of the photoelectric theodolite, it is becoming more and more difficult to detect and diagnose the fault of the photoelectric theodolite, and it is urgent to carry out testable design. [0004] In the prior ar...
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IPC IPC(8): G01C25/00
CPCG01C25/00
Inventor 王鹤淇彭树萍于洪君王伟国姜润强李博刘廷霞
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI