Dichotomization testing method for voltage sag withstanding capability
A technology of voltage sag and testing method, which is applied in the direction of testing dielectric strength, etc., can solve the problems of poor accuracy and low workload, and achieve the effects of accurate tolerance, accurate testing, and guaranteed accuracy
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[0050] The present invention will be further described in detail below with reference to the drawings and specific embodiments. This embodiment uses part of the test plan in the IEEE1668 standard, for example, the maximum test time (2s) and amplitude change (0-85%). After a simple initial test, the minimum time is set to 0s, which is to include some particularly sensitive equipment.
[0051] In this embodiment, an amplitude step size of 2% is set, because too large a step size will reduce the test accuracy, and a too small step size will greatly increase the workload. And keeping the voltage sag amplitude unchanged, the voltage sag test time point is determined based on the dichotomy method. First, the minimum and maximum voltage sag durations are tested. The device trips under the two durations are different, and the next one continues. The time is the median of these two times, and the next test duration is the median of this median time device trip condition and the duration ...
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