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Dichotomization testing method for voltage sag withstanding capability

A technology of voltage sag and testing method, which is applied in the direction of testing dielectric strength, etc., can solve the problems of poor accuracy and low workload, and achieve the effects of accurate tolerance, accurate testing, and guaranteed accuracy

Active Publication Date: 2018-05-29
SICHUAN UNIV
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Problems solved by technology

[0023] The workload of the test method recommended by the C4.110 working group is fixed and very low, because it only fixes three test points for testing, which also leads to the worst accuracy and only approximate results

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  • Dichotomization testing method for voltage sag withstanding capability
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  • Dichotomization testing method for voltage sag withstanding capability

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Embodiment Construction

[0050] The present invention will be further described in detail below with reference to the drawings and specific embodiments. This embodiment uses part of the test plan in the IEEE1668 standard, for example, the maximum test time (2s) and amplitude change (0-85%). After a simple initial test, the minimum time is set to 0s, which is to include some particularly sensitive equipment.

[0051] In this embodiment, an amplitude step size of 2% is set, because too large a step size will reduce the test accuracy, and a too small step size will greatly increase the workload. And keeping the voltage sag amplitude unchanged, the voltage sag test time point is determined based on the dichotomy method. First, the minimum and maximum voltage sag durations are tested. The device trips under the two durations are different, and the next one continues. The time is the median of these two times, and the next test duration is the median of this median time device trip condition and the duration ...

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Abstract

The invention discloses a dichotomy test method for the voltage sag withstanding capability. According to the method, a voltage sag amplitude is determined and a fault situation of a device within maximum duration time Tmax at the amplitude is tested; to be specific, the device has no fault within the maximum duration time, the device withstands the voltage sag at the amplitude and testing is stopped; and if a fault occurs at the device within the maximum duration time and the device works normally at a minimum duration time point, next testing duration time is a mid value between the maximumduration time and the minimum duration time; and the rest of the process is done in the same manner and next testing duration time is a mid value between the testing duration time of a detected deviceand the testing duration time of the tested device in a last different state until a difference between Tn and Tn+1 does not exceed 5ms. According to the method disclosed by the invention, the voltage sag withstanding capability testing is done accurately; while the high precision is ensured, the work load needed by the testing is reduced substantially; and thus the testing time is saved and thetesting is completed precisely and quickly.

Description

Technical field [0001] The invention relates to the technical field of voltage drop tolerance testing, in particular to a dichotomy test method for voltage sag tolerance. Background technique [0002] Electrification is known as the greatest engineering achievement of the 20th century. The power grid is also known as the most complex man-made network in the world. It is currently considered the most basic condition of life. The power quality of today’s power supply generally meets the needs of ordinary consumers, but it may still undergo major changes due to differences in time or region, which causes voltage interruptions or voltage abnormalities to occur frequently, although people also accept it in some places This situation. However, in today's highly developed industrial and digital economy era, the production process has higher requirements for power quality. These customers require higher power quality and more reliable power supply, and they hope to reduce voltage inter...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/12
CPCG01R31/12
Inventor 汪颖肖先勇桂良宇李长松
Owner SICHUAN UNIV
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