Ice layer thickness measuring device based on piezomagnetic materials

A piezomagnetic material and measuring device technology, applied in electromagnetic measuring devices, electrical/magnetic thickness measurements, measuring devices, etc., can solve problems such as the inability to accurately measure the thickness of the ice layer and the inability to accurately determine the position of the interface on the ice layer. , to achieve the effect of simple structure, convenient installation and maintenance, accurate thickness

Active Publication Date: 2018-06-22
TAIYUAN UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since the electrical properties such as electrical conductivity and dielectric constant of air and ice are very similar, neither of these two methods can accurately determine the position of the upper interface of the ice layer, and thus cannot accurately measure the thickness of the ice layer

Method used

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  • Ice layer thickness measuring device based on piezomagnetic materials
  • Ice layer thickness measuring device based on piezomagnetic materials

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Embodiment Construction

[0016] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0017] The present invention includes sensing unit 10, chip selection circuit 3, microcontroller 4, data acquisition circuit 5, power supply circuit 6 and shell 12, such as figure 1 shown.

[0018] There are multiple sensing units 10 which are independent of each other, and each sensing unit 10 includes a piezomagnetic material 1 and a coil 2; The chip selection circuit 3 includes a plurality of chip selection switches 11, and the chip selection switches 11 are connected through a data bus. The number of chip selection switches 11 is consistent with the total number of pins of all sensing units 10; each sensing unit 10 has two coil pins; each coil pin is connected to the input end of a chip selection switch 11; The output ends of all the chip select switches 11 connected to the first coil pin of the sensing unit 10 are...

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Abstract

The invention relates to ice layer thickness measuring devices, in particular to an ice layer thickness measuring device based on piezomagnetic materials, belongs to the technical field of automatic detection, and solves the technical problem that a contact type ice layer thickness measuring device or sensor is complex in structure or large in measuring error and the like in the prior art. The icelayer thickness measuring device comprises a plurality of sensing units, a chip selection circuit, a microcontroller, a data collecting circuit, a power circuit and a shell, wherein the sensing unitsare independent of one another, and each sensing unit comprises one piezomagnetic material and a coil and is capable of converting stress change, caused by air above an ice layer, the ice layer or water under the ice layer, of the piezomagnetic material into inductance value change; the microcontroller controls the chip selection circuit and the data collecting circuit to sequentially measure theinductance value of each sensing unit, and the positions of the upper and lower interfaces of the ice layer is determined by comparing the inductance values of the sensor units so as to calculate thethickness of the ice layer. The ice layer thickness measuring device is simple in structure, stable, reliable, convenient to mount and maintain and the like.

Description

technical field [0001] The invention relates to an ice layer thickness measuring device, in particular to an ice layer thickness measuring device based on a piezomagnetic material, which belongs to the technical field of automatic detection. Background technique [0002] In the fields of weather forecasting, ice flood prevention, and structural health monitoring of facilities, the change of ice thickness is an important environmental parameter that needs to be measured. In order to measure the thickness of the ice layer, people have to drill holes in the ice and use a ruler to measure the thickness of the ice layer. Although this method of manual measurement is accurate, it is time-consuming, labor-intensive and dangerous, and cannot continuously and real-time monitor changes in ice thickness. [0003] Later, some contact ice thickness measurement techniques and devices appeared one after another. Chinese patent (201210139060.2) discloses a dual-system ice layer thickness ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B7/06
CPCG01B7/10
Inventor 程鹏崔丽琴宋春花张丽邓霄丁喆张文凯冯启
Owner TAIYUAN UNIV OF TECH
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