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Substrate to be detected and method and equipment for detecting breakage of glass

A technology to be inspected and the substrate, applied in the direction of measuring devices, coatings, instruments, etc., can solve problems such as equipment damage, scratched abutment, cost loss, etc., to improve utilization rate, avoid mechanical damage, reduce time and material the wasteful effect of

Active Publication Date: 2018-06-29
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Whether in the process of transmission or equipment process, there is a great risk of glass fragments, not only because of the cost loss caused by the fragments themselves, but also because of the fragments that may cause certain damage to the equipment, such as scratching the abutment or scratching Injured alignment pin (ie, alignment Pin)
[0004] Therefore, the technical solutions in the prior art still have room for improvement for detecting whether the glass is damaged in time.

Method used

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  • Substrate to be detected and method and equipment for detecting breakage of glass
  • Substrate to be detected and method and equipment for detecting breakage of glass
  • Substrate to be detected and method and equipment for detecting breakage of glass

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Embodiment Construction

[0044] Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete and will fully convey the concept of example embodiments to those skilled in the art. The drawings are merely schematic illustrations of the present disclosure and are not necessarily drawn to scale. The same reference numerals in the drawings denote the same or similar parts, and thus repeated descriptions thereof will be omitted.

[0045] Furthermore, the described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided in order to give a thorough understanding of embodiments of the present disclosure. However, those skilled in ...

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Abstract

The invention provides a substrate to be detected and a method and equipment for detecting the breakage of glass, and belongs to the technical field of display. The substrate to be detected comprisesa glass substrate and a conductive film layer formed at an edge of the glass substrate. The method comprises the following steps: firstly forming the conductive film layer at the edge of the glass substrate, then inputting preset current into one edge, carrying out current detection on the edge to reflect the resistance change condition, and judging the completeness of the edge and the peripheralcrack condition of the glass substrate. By adoption of the detection mode, the breakage condition of the glass substrate can be found in time, the process defects caused by breakage and cracks of thesubstrate can be reduced, and the waste of time and materials to following processes can be further reduced.

Description

technical field [0001] The present disclosure relates to the field of display technology, in particular, to a substrate to be detected, a method and equipment for detecting glass breakage. Background technique [0002] At present, thin glass is a new development trend in the display industry, but during the manufacturing process, the risk of glass fragmentation is also high due to the thickness of the glass being too thin. [0003] In the current technology, glass fragments can only be detected through the abnormal vacuum adsorption alarm of the equipment base, or glass fragments can be found by human eyes. No matter in the process of transmission or equipment process, there is a great risk of glass fragments, not only because of the cost loss caused by the fragments themselves, but also because of the fragments that may cause certain damage to the equipment, such as scratching the abutment or scratching Damage to the alignment needle (ie alignment Pin). [0004] Therefore...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/00G01N27/20C03C17/22C03C17/245
CPCC03C17/22C03C17/2453C03C2217/231C03C2218/153C03C2218/154G01N27/00G01N27/205
Inventor 阮士薪冯慧范晓旺贾丹王武
Owner BOE TECH GRP CO LTD