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Calibration Method for Multidimensional Polyline Segment Measurement

A polyline segment and calibration method technology is applied in the field of multi-dimensional polyline segment measurement and calibration method, which can solve the problems of difficulty of two-dimensional calibration of sample data, problems in the use of polyline segment calibration method, etc., so as to improve measurement accuracy and achieve good results. Effect

Active Publication Date: 2020-11-10
上海微波技术研究所(中国电子科技集团公司第五十研究所)
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Problems solved by technology

However, when there are more factors affecting the measurement, that is, when the calibration sample data has more dimensions, the look-up table calibration method can be used; for the polyline segment calibration method, it is difficult to use the two-dimensional calibration sample data, especially when the influence is When there are more factors to be measured, the dimensionality of the calibration sample data will be more, and the use of the polyline segment calibration method will be more problematic.

Method used

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  • Calibration Method for Multidimensional Polyline Segment Measurement
  • Calibration Method for Multidimensional Polyline Segment Measurement

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Embodiment 1

[0051] The measured audio voltage is denoted as v, the direct measurement parameter is ADC sampling data, denoted as d, and the temperature is a factor affecting the measurement, denoted as t.

[0052] The first step is to determine the measurand, the directly measured parameters and all factors affecting the measurement. In this example, the audio voltage v is measured, the direct measurement parameter is ADC sampling data d, and the factor affecting the measurement is temperature t.

[0053] The second step is to determine the number of measurement points for each influencing factor and the number of direct measurement parameters, and measure the value of the direct measurement parameter through the standard measured value, that is, the calibration sample data. In this example, the number of measurement points affecting the measurement factor t is n, that is, T 1 , T 2 ...T n , the number of measurement points for direct measurement of parameter d is m, and since there is...

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Abstract

The invention discloses a multi-dimensional line segment measurement calibration method. The method comprises the steps of (S1) determining measured parameters and direct measurement parameters and all factors that affect measurement, (S2) determining the number of measurement points of each measurement influence factor and the number of measurement points of the direct measurement parameters andmeasuring the values of the direct measurement parameters through a standard measured value, wherein the values are calibration sample data, one-dimensional calibration sample data is formed by the direct measurement parameters, and one dimension of calibration sample data is increased when each factor which affects measurement is increased, and (S3) carrying out line segment calibration measurement based on the calibration sample data, wherein the calibration of a line segment is gradually advanced from a highest dimension to a one dimension. According to the method, the calibration problem of a multi-dimensional line segment is solved, the limitation of the use of the line segment calibration is broken, and especially when the number of the measurement points is finer, the measurement precision can be greatly improved. The method is used in the calibration of a plurality of test instruments, and good effects are obtained.

Description

technical field [0001] The invention relates to the field of test and measurement, in particular to a method for measuring and calibrating multidimensional broken line segments. Background technique [0002] In the field of test measurement, the measurand is often affected by single or multiple factors, and there may be a nonlinear relationship between the measurand and the influencing factors. At present, the broken line segment method or the look-up table method is often used for calibration, because the broken line segment calibration method approximates the non-measurement point between two measurement points with a broken line segment, and the table look-up calibration method only uses the measurement point for the non-measurement point. Instead, the broken line segment calibration method has higher measurement accuracy than the look-up table calibration method and is more widely used. However, when there are more factors affecting the measurement, that is, when the ca...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01D18/00G06F17/17
CPCG01D18/00G06F17/17G06F17/175
Inventor 杨文举
Owner 上海微波技术研究所(中国电子科技集团公司第五十研究所)
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