The invention discloses a measuring method of an automatic comprehensive panel detecting device. The method includes the steps of measuring panel parameters on the device according to measuring points and scanning line segments; measuring parameters including length, width, side straightness, squareness, central bending degree, side bending degree and warping degree according to the measuring points. The parameter measuring step includes the substeps of collecting values of firstly, a standard measuring panel, wherein a measuring point zero value database set on the standard board is established; secondly, measuring a to-be-detected sample, wherein the measuring value of the to-be-detected sample at the same point location as the standard board is measured; thirdly, conducting calculation, wherein data collected by an industrial personal computer according to sensors is calculated; fourthly, displaying and storing the measuring result. The step of measuring the thickness according to the scanning line segments does not include the first step, and the measuring value is obtained after the two sensors are driven to the measuring points on the front side and the back side of the to-be-detected sample to scan the scanning line segments respectively. The method has the advantages of being comprehensive in measuring parameter, wide in range, automatic in measuring process and high in work efficiency.