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Multi-probe and single-probe integrated test system and test method

A comprehensive testing, single-probe technology, applied to the antenna radiation pattern and other directions, can solve the problems of large size, unrealistic, and difficult measurement of the millimeter wave band to the millimeter wave band of the waveguide and spread spectrum module, so as to improve the detection effect, Meet the test requirements and the effect of diversified test forms

Pending Publication Date: 2018-07-03
SUNYIELD TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] In the antenna measurement system, the measured object that needs to measure the electromagnetic performance usually has wavelengths in different frequency bands from the meter-wave frequency band to the millimeter-wave frequency band, and a probe can only cover a limited section. In order to achieve the meter-wave frequency band to mm The frequency coverage of the wave-level frequency band generally requires dozens of probes, which cannot be realized in a single multi-probe array; at the same time, the probes of the meter-wave level frequency band are generally relatively large, and the size can usually be 1 meter to 3 meters. It is difficult to arrange a multi-probe array on an arc array. Although the millimeter-wave frequency band probe is small in size, the waveguide and spread spectrum module it is equipped with is also very large. Realistic, so in the existing antenna measurement system, it is very difficult to realize the measurement from the meter-wave frequency band to the millimeter-wave frequency band

Method used

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  • Multi-probe and single-probe integrated test system and test method

Examples

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Effect test

Embodiment 1

[0047] Embodiment one: a kind of multi-probe and single-probe comprehensive test system, such as figure 1 As shown, there is a bearing platform on the ground for placing the measured object, and a multi-probe array device and a multi-probe array device for measuring the radiation characteristic data of the frequency band between the meter wave level and the millimeter wave level are arranged on both sides of the bearing platform. A single-probe detection device for measuring radiation characteristic data extending up and down the meter-wave level frequency band and the millimeter-wave level frequency band.

[0048] Such as figure 1 As shown, the probe array device includes a support frame 11, a mounting ring 12, and a plurality of first probes 13. Slide rails 4 are fixed on both sides of the bearing platform on the ground, and the support frame 11 is slidably connected to the slide rails 4. The support frame 11 There is a slide block matched with the slide rail 4, and the sli...

Embodiment 2

[0063] Embodiment two: a kind of multi-probe and single-probe comprehensive test system, such as Figure 5 As shown, the difference from Embodiment 1 is that the central angle of the mounting ring 12 is 180°, and the detection makes the loading platform 31 rise at the center of the mounting ring 12, so that the first probe 13 and the second probe can be 23 Complete the detection of the entire spherical surface of the measured object.

Embodiment 3

[0064] Embodiment three: a kind of multi-probe and single-probe comprehensive test method, comprising

[0065] Step 1: Place the measured object on the loading platform 31, adjust the position of the measured object so that the measured object is located at the center of the mounting ring 12, and adjust the height of the swing arm 22 so that the rotation center of the swing arm 22 is in line with The center of the measured object is aligned, the third drive motor 322 is started to drive the loading platform 31 to rotate, and the first probe 13 is controlled to test the radiation characteristic data of the measured object in the frequency band between the meter wave level and the millimeter wave level. The detection process In order to control the gradual rotation of the loading platform 31, the first probe 13 gradually tests the data in each section of the measured object, thereby obtaining the data in the entire spherical surface of the measured object;

[0066] Step 2: Start...

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Abstract

The invention discloses a multi-probe and single-probe integrated test system and a multi-probe and single-probe integrated test method, which aim at solving the disadvantage of the existing antenna measurement system that measurement from a meter wave level frequency band to a millimeter wave level frequency band cannot be realized. The multi-probe and single-probe integrated test system is characterized by comprising a rotatable bearing platform, a multi-probe array device and a single-probe detecting device, wherein the multi-probe array device is positioned on one side of the bearing platform, and comprises a plurality of first probes which are distributed in a ring array and used for realizing frequency band detection between meter wave and millimeter wave levels; and the single-probedetecting device is positioned on one side opposite to the multi-probe array device, and comprises a second probe which can rotate around a tested object to form a detection arc surface and is used for detecting up-down extension of the meter wave level frequency band and the millimeter wave level frequency band. The multi-probe and single-probe integrated test system and the multi-probe and single-probe integrated test method realize the measurement of radiation feature data of the tested object from the meter wave level frequency band to the millimeter wave level frequency band, and are more convenient in measurement process.

Description

technical field [0001] The invention relates to the technical field of antenna measurement, more specifically, it relates to a multi-probe and single-probe comprehensive test system and test method. Background technique [0002] In the antenna measurement system, the measured object that needs to measure the electromagnetic performance usually has wavelengths in different frequency bands from the meter-wave frequency band to the millimeter-wave frequency band, and a probe can only cover a limited section. In order to achieve the meter-wave frequency band to mm The frequency coverage of the wave-level frequency band generally requires dozens of probes, which cannot be realized in a single multi-probe array; at the same time, the probes of the meter-wave level frequency band are generally relatively large, and the size can usually be 1 meter to 3 meters. It is difficult to arrange a multi-probe array on an arc array. Although the millimeter-wave frequency band probe is small i...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/10
CPCG01R29/10
Inventor 刘科宏
Owner SUNYIELD TECH CO LTD
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