Sensor testing method, device and readable storage medium
A test method and test device technology, applied in the field of electronics, can solve the problems of low test efficiency of light-sensing-distance sensors, and achieve the effect of improving SMT production capacity
Inactive Publication Date: 2020-07-17
QIKU INTERNET TECH SHENZHEN CO LTD
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Problems solved by technology
[0007] In view of the above situation, it is necessary to provide a sensor testing method, device and readable storage medium for the low test efficiency of light-sensing-distance sensors in the prior art
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no. 1 example
[0097] Compared with the first embodiment, in this embodiment, the light intensity sensor, the power supply circuit and the I 2 The detection of the C circuit is more accurate and reliable. And, when the test of each stage fails, a prompt message is sent to remind the user to troubleshoot.
[0098] see image 3 , is the sensor testing device in the third embodiment of the present invention, which is applied to the main board, the sensor is connected to the main board, and a baffle is set at a preset distance from the main board during testing, and the sensor includes a light Intensity sensor and infrared emitter, the sensor testing device includes:
[0099] A judging module 100, configured to acquire the ambient light brightness detected by the light intensity sensor under different gain parameter conditions, and judge whether the ambient light brightness changes with the change of the gain parameter;
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The invention relates to a sensor test method and device and a readable storage medium applied to a mainboard. A sensor is connected to the mainboard, during test, a baffle plate is arranged in a position which is in a preset distance from the mainboard, and the sensor comprises a luminous intensity inductor and an infrared ray emitter used to sense the ambient light and infrared light respectively. The sensor test method comprises that ambient light brightness detected by the luminous intensity inductor under different gain parameter conditions are obtained, and whether the ambient light brightness change with the gain parameter is determined; if YES, infrared emission power is changed to simulate test that the baffle plate is close to and far from the sensor; and when the test succeeds,it is determined that the sensor is functionally normal. The method can be used to detect whether an ALSP-Sensor circuit and device are functionally normal rapidly during SMT.
Description
technical field [0001] The invention relates to the field of electronic technology, in particular to a sensor testing method, device and readable storage medium. Background technique [0002] With the continuous development of electronic technology, smart terminal devices, such as mobile phones and tablet computers, have gradually become important tools for people to communicate with the outside world and manage personal resources, bringing many conveniences to people's lives. [0003] As the applications and functions of smart terminals continue to increase, various sensors are gradually applied to smart terminals. In the prior art, the sensors used by the terminal include a gravity sensor, a gyroscope, a light-sensing distance sensor, and the like. Among them, the light sensing-distance sensor (ALSP-Sensor) is an important component of the intelligent terminal equipment. It has two main functions: [0004] First, adjust the brightness of the screen by sensing the intens...
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IPC IPC(8): G01D18/00
CPCG01D18/00
Inventor 李玮琮
Owner QIKU INTERNET TECH SHENZHEN CO LTD