CIS-based squint imaging device and method

Abstract

The invention relates to the technical field of imaging, and particularly discloses a CIS-based squint imaging device and method. The device comprises a light source irradiated on a surface of an object to be tested, a CIS sensor capable of receiving light reflected by the light source from the surface of the object to be tested, and an imaging circuit connected to the CIS sensor, wherein the light source forms an angle a with the surface of the object to be tested; the CIS sensor forms an angle b with the surface of the object to be tested to receive the light reflected by the light source from the surface of the object to be tested; and the value range of a is that a is greater than 80 degrees and less than 90 degrees, and the value range of b is that b is greater than 20 degrees and less than 30 degrees. According to the scheme of the invention, the image collection quality can be ensured, the phenomena of overexposure and light reflection can be effectively prevented, the concave and convex effect on an image can be clearly identified by only taking one photo, and the working efficiency can be improved.

Description

technical field [0001] The invention relates to the field of imaging technology, in particular to a CIS-based squint imaging device and method. Background technique [0002] At present, most of the imaging methods on the market are top-down imaging and squint imaging. The top-down imaging uses a low-side light for initial footprint visualization, and uses CMOS or linear CCD top-down imaging. This method will miss many footprint details, and many difficult footprints are Imaging is not possible; strabismus imaging uses CMOS or linear CCD imaging, this method the overall picture is very blurry, and many footprint details of luminous objects such as tiles cannot be displayed. [0003] In order to solve the above problems, an invention patent application with the application number 201010533349.3 and titled "A Multi-angle Optical Feature Detection Method and Device" appeared. This application introduced a CIS sensor and simultaneously acquired the first image of the detection ar...

AI Technical Summary

Problems solved by technology

However, it still has the following disadvantages: when the CIS sensor takes light, it is still perpendicular to the surface of the measured object, which is prone to overexposure and reflection, and cannot solve the problem of oblique imaging of smooth objects; and the unevenness of the surface of the measured object is not good. First, there is no guarantee that images with different concave and convex conditions can maintain a good shooting effect; two images need to be collected for analysis, and the work efficiency is not high

Images