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Defect marking method and apparatus, coil material and sheet manufacturing methods, and the coil material and sheet

A defect location and defect technology, applied in the direction of measuring devices, optical testing flaws/defects, analyzing materials, etc., can solve problems such as unrecorded defect information

Active Publication Date: 2018-09-14
SUMITOMO CHEM CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Therefore, in the previous defect labeling, the above-mentioned defect information was not recorded

Method used

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  • Defect marking method and apparatus, coil material and sheet manufacturing methods, and the coil material and sheet
  • Defect marking method and apparatus, coil material and sheet manufacturing methods, and the coil material and sheet
  • Defect marking method and apparatus, coil material and sheet manufacturing methods, and the coil material and sheet

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Embodiment Construction

[0081] Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

[0082] In this embodiment, for example, as a production system of an optical display device, a film manufacturing apparatus (roll material manufacturing apparatus) constituting a part thereof and a film manufacturing method (roll material manufacturing method) using the film manufacturing apparatus will be described. .

[0083] Film manufacturing equipment manufactures, for example, film-shaped optical members (optical films) such as polarizing films, retardation films, and brightness enhancement films that are bonded to panel-shaped optical display components (optical display panels) such as liquid crystal display panels and organic EL display panels. ). The film manufacturing apparatus constitutes a part of a production system for producing optical display devices including such optical display components and optical members.

[0084] In this embodiment mo...

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Abstract

The invention provides a defect marking method and apparatus that are suitable for showing positions of defects, a manufacturing method of a coil material, the coil material, a manufacturing method ofa sheet, and the sheet. The defect marking method includes steps of performing defect inspection to a to-be-detected object, marking defect positions on the to-be-detected object according to the inspection results, and printing a first print pattern PT1 and a second print pattern PT2 on the surface of the to-be-detected object in a manner that the defect D is loacted between the first print pattern PT1 and the second print pattern PT2 which are formed, adjacently, in another direction being crossed with a direction in the plane of the to-be-detected object, thus showing the position of the defect D.

Description

technical field [0001] The invention relates to a defect labeling method and a defect labeling device, a coil material manufacturing method and coil material, and a sheet manufacturing method and sheet. Background technique [0002] For example, in the manufacturing process of long strip-shaped coil materials such as resin film and paper, the defect inspection of the coil material is carried out while the coil material is being conveyed, and the defect inspection is carried out at the defect position of the coil material according to the result of the defect inspection. Labeling (hereinafter referred to as defect labeling) (for example, refer to Patent Documents 1 to 4). [0003] In addition, in the manufacturing process of optical films (sheets) such as polarizing plates used in liquid crystal display panels, the following operation is also performed: using a printing head to print information related to defects such as the position, type, size, and inspection method of def...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88G01N21/89
CPCG01N21/8851G01N21/8914G01N2021/8874G01N2021/888G01N21/892
Inventor 井村圭太越野哲史
Owner SUMITOMO CHEM CO LTD
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