Thermal resistance test circuit and method of reverse conduction type igbt
A test circuit, reverse conduction type technology, applied in the direction of single semiconductor device testing, measuring electricity, measuring electrical variables, etc., can solve the problem of low accuracy of thermal resistance testing
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[0020] In one embodiment, such as figure 1 As shown, a thermal resistance test circuit of a reverse conduction type IGBT includes a control circuit 110, a gate voltage source 120, a test current source 130 and a heating current source 140, and the gate voltage source 120, a test current source 130 and a heating current source 140 are all connected to the control circuit 110, the gate voltage source 120, the test current source 130, the heating current source 140 and the control circuit 110 are all used to connect the reverse conduction IGBT to be tested, wherein the reverse conduction IGBT to be tested includes a gate, a collector electrode and emitter, the control circuit 110 controls the test current source 130 to output a reverse test current to the reverse conduction type IGBT to be tested to obtain a preset reverse test current condition, the voltage drop between the collector and the emitter of the reverse conduction type IGBT to be tested With the curve of the junction ...
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