High and low temperature test method and to-be-tested terminal

Abstract

Embodiments of the invention relate to the field of hardware testing, and disclose a high and low temperature test method and a to-be-tested terminal. The high and low temperature test method is applied to the to-be-tested terminal. The to-be-tested terminal is placed in a test incubator; a target temperature in the test incubator is automatically changed according to a preset instruction; a temperature sensing apparatus is arranged in the test incubator; and the temperature sensing apparatus is in communication connection with the to-be-tested terminal. The test method comprises the steps ofobtaining an environment temperature of the test incubator through the temperature sensing apparatus; detecting the temperature of the to-be-tested terminal under the environment temperature; and in the process that the target temperature in the test incubator is automatically changed according to the preset instruction, recording the obtained environment temperature of the test incubator and thedetected temperature of the to-be-tested terminal as test files. Therefore, the test method saves time and labor, and is very convenient for test personnel.

Description

technical field [0001] The embodiments of the present invention relate to the field of hardware testing, in particular to a high and low temperature testing method and a terminal to be tested. Background technique [0002] At present, in the test of the terminal to be tested, it is usually artificial to go to the test incubator at each specific temperature point to check the temperature of the test incubator and the temperature of the terminal to be tested, and the terminal to be tested can only be known in the form of screenshots every minute temperature, and see the pop-up warning prompt box. In the actual test, it is usually artificial to see that the temperature value of the test terminal is close to or reaches the ambient temperature value of the test incubator, and then manually adjust the next ambient temperature value. [0003] However, the inventor found that there are at least the following problems in the prior art: in the existing test method, it is impossible t...

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Problems solved by technology

[0003] However, the inventor found that there are at least the following problems in the prior art: in the existing test method, it is impossible to know the difference between the temperature value of the terminal to be tested and the ambient temperature in the test incubator, and it is time-consuming to view a large number of screenshots. It is also basically artificially checked at a specific time point to ensure the accuracy of the test. It can be seen that the test method in the prior art is time-consuming and labor-intensive, which is very inconvenient for testers

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