Structured light adaptive three-dimensional measurement method based on camera response curve

Abstract

The invention provides a structured light adaptive three-dimensional measurement method based on a camera response curve. The method comprises steps: a measurement gray value range and an exposure time range are preset, and in the preset measurement range, a reference image and reference exposure time are acquired; a reference point in the reference image is selected, and according to the exposureand the gray value obtained along with changes of the exposure time of the reference point, a camera response function is calculated; the camera response function is used to acquire relative irradiance values of all points, and based on the relative irradiance values and the camera response function, the exposure frequency and the exposure time are calculated; and images acquired in different exposure time are fused to a new stripe image sequence for three-dimensional reconstruction. An object with complex surface reflectivity can be adaptively reconstructed, the application range of a structured light measurement technology is expanded, the automatic degree of the measurement is improved, and good measurement effects can be achieved for a complex reflectivity surface.

Description

technical field [0001] The invention belongs to the technical field of optical measurement, in particular to a structured light adaptive three-dimensional measurement method based on a camera response curve. Background technique [0002] Structured light measurement technology is an active optical measurement that projects a certain pattern of grating fringe images onto the surface of the object to be measured, and the camera acquires the deformed grating image modulated by the shape of the object to be measured, and then calculates the three-dimensional information data of the object to be measured. technique, which is very sensitive to the intensity of the raster image. When the surface is overexposed or underexposed, such as specular reflection, the camera imaging cannot truly reflect the true intensity value of the surface, resulting in a decrease in measurement accuracy or failure to reconstruct. The multiple exposure technology is applied in the structured light recon...

AI Technical Summary

Problems solved by technology

Although the method of structured light technology combined with multiple exposures has achieved good measurement results, the exposure time and number of exposures are all based on operator experience, which affects measurement efficiency and industrial applications.

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