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Phase calculation method applied to fixture parameter extraction

A technology of parameter extraction and phase calculation, applied to the phase angle between voltage and current, measuring devices, instruments, etc., can solve the problems of increasing operation steps, lack of offset, reducing test efficiency, etc., to reduce test steps, The effect of improving test efficiency

Active Publication Date: 2018-11-20
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Application Information

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Problems solved by technology

Direct processing, there are two problems in the obtained fixture phase parameters: 1. The phase is folded, that is, the phase is between +180° and -180°. After the direct square root, the phase will be between +90° and -90° Folding; 2. The offset of the initial phase corresponding to the first frequency point is unknown, so after the square root, the offset part is missing
The disadvantage is that the delay of the fixture needs to be known in advance and requires human input
Since the fixture itself is difficult to measure, the delay of the fixture cannot be accurately obtained
And the human input process increases the operation steps, reducing the test efficiency

Method used

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  • Phase calculation method applied to fixture parameter extraction
  • Phase calculation method applied to fixture parameter extraction
  • Phase calculation method applied to fixture parameter extraction

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Embodiment Construction

[0039] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0040] The present invention proposes a method for compensating the phase in extracting fixture data.

[0041] The specific process is as figure 1 Shown:

[0042] 1. The phase value is obtained from the real part and imaginary part of the S parameter of each frequency point, and the calculation formula is as follows:

[0043]

[0044] in, is the phase value of the S parameter; a is the real part data of the S parameter; b is the imaginary part data of the S parameter.

[0045] 2. Linearly expand the phase value of the S parameter at each frequency point (the process is as follows figure 2 shown).

[0046] Since the phase calculated by the above method is always between ±180°, it cannot reflect the real phase change of the device, so the phase needs to be expanded linearly:

[0047]

[0048] in, is the phase value of the period ex...

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Abstract

The invention discloses a phase calculation method applied to fixture parameter extraction and belongs to the test technology field. The phase calculation method applied to fixture parameter extraction comprises steps that a phase value is obtained through a real part and a imaginary part of each frequency point S parameter; the phase of each frequency point S parameter is linearly expanded; the phase is subjected to threshold determination; the slope of phase change is calculated; the offset phase is calculated through utilizing the 0-frequency down phase; the phase of the square root is calculated. The method is advantaged in that knowing delay of the fixture in advance is needed, manually inputting parameters is not required for solving, test steps are reduced, and test efficiency is improved.

Description

technical field [0001] The invention belongs to the technical field of testing, and in particular relates to a phase calculation method applied to fixture parameter extraction. Background technique [0002] With the development of electronic information technology, the packaging forms and interface types of devices are also increasing. When using a network analyzer to test such devices, it is necessary to introduce a fixture. Therefore, it is necessary to eliminate the influence of the fixture during the test. In the prior art, fixture parameters can be quickly extracted by means of time-domain analysis, but the square root of S parameters is required in the process of extracting parameters. For the square root of a complex number, it is necessary to judge its phase, which is usually determined by artificially inputting a delay value. [0003] Now that there are more and more connectors, the testing requirements are also increasing. In the face of various devices and con...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R25/00
CPCG01R25/00
Inventor 庄志远袁国平李树彪杨明飞蔡洪坤肖波涛
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP