The invention discloses a temperature environment construction method and
system for
chip test calibration, and relates to the technical field of
chip test
processing, and the method comprises the steps: S1, test
memory bank statistics, S2,
chip prior
test data preprocessing, S3, test environment construction temperature interval acquisition, and S4, temperature environment cooperative adjustment construction. According to the invention, pertinent analysis of prior data is carried out on the to-be-tested
memory bank, and the test environment of the to-be-tested
memory bank is obtained to construct the temperature interval, so that the problem that the temperature environment setting is too one-sidedness when the memory
bank is tested at present is effectively solved; according to the method, the characteristic of inconsistency of the actual application performance of the memory
bank can be fully considered, so that the situation that whether the temperature of the memory
bank reaches a set value or not is singly sensed and judged is avoided, complex temperature environment conditions can be accurately simulated, and powerful data support guarantee is provided for the accuracy of a test result.