37 results about "Electronic microscopy" patented technology

The present application provides a laminate with high yield strength. The laminate, which is a laminate comprising a resin film, and a metal layer provided on at least one face of the resin film, has a skewness Psk of 0.05 or more in a cross-sectional image of the laminate in the thickness direction, obtained by a scanning electron microscope, from a cross-sectional curve of the interface between the resin film and the metal layer.

Described herein are machine learning based systems, methods, and non-transitory computer readable media for determining three-dimensional (3D) information of structures of a patterned substrate. The 3D information can be determined using a neural network to convert a two-dimensional image to a 3D image. In a method, the neural network is trained by supplying varying parameters to simulated images of a sample to model a real manufactured IC structure. The trained network generates a depth map from a newly supplied image of the sample to predict defect locations. The depth map can be converted to a binary map to predict defect size and location, which can be used to guide inspection of the sample using an inspection tool.

A method of analyzing a rock sample includes segmenting a digital image volume corresponding to an image of the rock sample to associate voxels in the digital image volume with a plurality of rock fabrics of the rock sample. The method also includes identifying a set of digital planes that intersect each of the plurality of rock fabrics. The method also includes mechanically machining the rock sample to expose a physical plane corresponding to the identified digital planes, performing scanning electron microscope (SEM) imaging of the physical plane to generate a two-dimensional (2D) SEM image of the physical plane, and performing image processing on the SEM image to determine a material property associated with each of the rock fabrics.

A scientific instrument, such as an electron microscope, is disclosed, and the scientific instrument includes a movable stage with a sample holder. A finger-shaped cryostat contacts a heat sink and includes a cooling plate configured to contact the sample holder to cool the sample holder in a rapid cooling position. A flexible heat-conducting component thermally connects the sample holder and the finger-shaped cryostat to cool the sample holder away from the rapid cooling position, where the sample can be studied, imaged, etc. In the disclosed embodiments, both the cryostat and the sample holder are movable, or only the finger-shaped cryostat moves between the rapid cooling configuration and other configurations. A corresponding method for operating the scientific instrument is also disclosed. This disclosure advantageously combines rapid cooling in the rapid cooling position with reduced restrictions on movement of the sample holder away from its parking position.

This invention relates to the field of image processing technology, and more specifically, to an intelligent contour analysis method for benzimidazolone pigment particles based on a graph search algorithm. The method includes: acquiring a grayscale image using an electron microscope and performing binarization segmentation; constructing a particle distance map based on Euclidean distance transformation; analyzing the curvature features of pixels in the particle distance map using the Hessian matrix to obtain the probability that a pixel in the particle distance map belongs to the core skeleton of the particle; extracting contour depression points based on the closed contour of the particle region; calculating the adhesion penalty intensity of each pixel in the particle distance map; accurately locating seed points by combining the skeleton probability and penalty intensity; and achieving precise cutting of adhered particles by constructing a graph model containing specific edge weights, using the seed points and background as constraints. This invention solves the problem of over-segmentation or under-segmentation caused by severe adhesion of pigment particles, improving the accuracy of contour recognition.

The invention relates to a sample holder tip for use in a charged particle microscope, such as a transmission electron microscope; a sample holder comprising said sample holder tip and methods of using said sample holder tip and sample holder.

The present invention aims to provide a novel carbon fiber having higher electrical conductivity. [Solution] The graphite-coated carbon fiber of the present invention is carbon fiber skeleton, Graphite particles covering the surface of the carbon fiber skeleton, and Carbonaceous binder that binds the graphite particles to the carbon fiber skeleton It has and When images were observed using a scanning electron microscope, the graphite particles covered 50% or more of the surface area of ​​the carbon fiber skeleton.

The application discloses a semiconductor manufacturing defect detection method, an electronic device and a storage medium, the method comprising: using a trained defect detection model to detect a scanning electron microscope (SEM) image to obtain a detection result; wherein the defect detection model is based on YOLOv8, and the overall loss function is a mixed loss function combining a classification loss and a regression loss; when the defect detection model performs feature extraction, frequency domain decoupling feature extraction is performed and spatial pixel-level feature fusion is performed, and a specially designed mixed loss function is combined to solve the problems of class imbalance and accurate positioning. Compared with the detection method of the prior art, the application has higher detection accuracy, stronger model robustness, and meets real-time requirements. While ensuring accuracy improvement, the inference speed that meets the production line beat is maintained, and finally, more robust and accurate automated detection of defects in semiconductor manufacturing, especially subtle and low-contrast defects, is realized.

This invention provides a standard silicon wafer for calibrating surface flatness measurement equipment. The standard silicon wafer includes a silicon substrate layer and a roughening layer formed on its surface. The surface roughness of the roughening layer can be precisely controlled within the range of 0.1 nm to 2 nm, and its roughness uniformity is no greater than 35%. This invention, by directly forming the roughening layer on the substrate, fundamentally solves the problems of easy particle detachment, poor stability, and difficulty in controlling uniformity inherent in traditional particle-coated standard wafers. This standard silicon wafer features structural stability, controllable parameters, and high uniformity, providing a reliable and traceable calibration benchmark for surface flatness measurement equipment such as atomic force microscopes and scanning electron microscopes, significantly improving the accuracy and consistency of surface morphology measurements in semiconductor manufacturing processes.

The application provides a battery monomer, a battery device and an electric equipment, comprising an electrode assembly, the electrode assembly comprising a positive electrode sheet, a negative electrode sheet and a separator film, the separator film being arranged between the positive electrode sheet and the negative electrode sheet; the positive electrode sheet comprising a positive electrode current collector and a positive electrode film layer on at least one side surface of the positive electrode current collector, the positive electrode film layer comprising lithium transition metal phosphate and lithium transition metal oxide, the lithium transition metal phosphate at least partially having a carbon coating layer; the lithium transition metal oxide comprising nickel element, cobalt element and manganese element; the separator film comprising a base film and an inorganic coating layer on at least one side of the base film, the inorganic coating layer containing inorganic particles, and the single-sided thickness being 1-3 microns; in a cross-sectional scanning electron microscope image in the thickness direction of the positive electrode sheet, the Dn50 of the lithium transition metal phosphate particles is 120-500 nm, and the Dn50 refers to the particle size when the cumulative number distribution of particles in a cumulative distribution curve of the number of particles reaches 50%. The battery monomer has good large-rate cycle performance.

An image generation method using a scanning electron microscope includes generating a first image by imaging a wafer sample at a low frame rate, generating a sample image by imaging a reference sample at a high frame rate, and generating a second image having a high signal-to-noise-ratio using phase information extracted from the first image and amplitude information extracted from the sample image, wherein the number of patterns included in the first image and the number of patterns included in the sample image are the same.

The disclosed subject matter relates to a computer system and a computer-implemented method for enhancing Scanning Electron Microscope (SEM) imaging output by mitigating and correcting imaging degradation due to charging distortion effects. The methods and systems presented address artifacts caused by charging distortions, improving the accuracy and reliability of SEM imaging for high-precision semiconductor applications. The solution enables rapid, efficient correction, and can be applied during runtime, such as within a semiconductor SEM scanning sequence, to generate augmented SEM images that facilitate more accurate analysis.

1. The name of the design product: mobile phone microscope (MS200X). 2. The use of the design product: for installation on a mobile phone, used as an electronic microscope. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view 1.

This application provides a method for selective leaching of valuable metals from cathode materials of spent lithium-ion batteries. By analyzing the microstructure of the particles using scanning electron microscopy, a three-dimensional model is constructed to simulate the acid leaching dissociation behavior. Combined with real-time concentration monitoring and sequence modeling to predict retention risk areas, the acid permeation path and leaching parameters are dynamically adjusted to form a stepwise leaching control scheme, ultimately achieving selective release of cobalt first, then nickel, and finally manganese. The core innovation of this invention lies in combining microstructure analysis with numerical simulation and real-time feedback to precisely control the leaching process, significantly improving the separation efficiency of valuable metals and reducing impurity interference, providing systematic and efficient technical support for the resource recycling of spent lithium-ion batteries.

The application relates to the technical field of heat dissipation materials, and discloses a precision die cutting and detection method for a heat dissipation material, which comprises the following steps: S1, digital modeling of material microstructure and mechanical properties: sampling the incoming material batch, observing the multilayer stacking structure of the material batch by using a scanning electron microscope, measuring the approximate value of the interlayer binding energy, and obtaining the elastic modulus, yield strength and brittle-ductile transition critical thickness in different directions by using a nanoindenter and a micro tensile testing machine; the four core strategies of material digitization, process self-adaptation, process active control and detection intelligentization are used in the application scheme, so that the precision die cutting of graphite sheets is changed from needing the processing experience of workers to a predictable and optimized precision manufacturing engineering driven by a system, and the application scheme is particularly suitable for the fields of 5G equipment, ultra-thin consumer electronics, high-reliability power devices and the like which have extremely high requirements for heat dissipation components.

The application discloses a kind of micropore repair tools, belong to the technical field of precision micropore repair processing.The core of the device relies on body microscope to realize accurate positioning, electron microscope is used for high-definition observation and video shooting record, cooperate precision bench drill, micron level drill bit, multidimensional adjustment sliding table and down pressure height table, realize 0.02mm level high-precision feeding control.The application is mainly used for the accurate dredging repair of single blockage nozzle of industrial inkjet nozzle, solves the problem of nozzle single hole failure and scrap, and can be applied to the processing, dredging and repair of semiconductor precision micropore device and small precision hole piece.The application is accurate in positioning, controllable in feeding, and can record the operation process in real time with high definition, greatly improves the precision, safety and traceability of micropore repair, and is widely applicable.

This invention discloses a sample preparation method and storage medium for ion irradiation transmission electron microscopy, comprising: cutting a metal sheet to obtain a blanking sheet; acquiring surface images and / or thickness distribution information of the blanking sheet, identifying candidate blanking regions, and determining the effective ion irradiation region; determining the target blanking position and target blanking posture, so that the target observation area of ​​the blanked sample covers the effective ion irradiation region; inputting candidate die parameters and image features and thickness features corresponding to the target blanking position and target blanking posture into a trained optimization model to determine the target die parameters; using a punch and die corresponding to the target die parameters to blank at the target blanking position and target blanking posture, and simultaneously forming a directional positioning notch, a repositioning reference mark, and a liquid exchange auxiliary structure; and performing a forming quality re-inspection on the blanked sample for subsequent precision thinning, corrosion immersion, and transmission electron microscopy observation.

This invention relates to the field of transmission electron microscope accessories, and in particular to a sample rod capable of loading multiple samples. The sample rod includes a rod body and a rod core, with the rod core passing through the rod body. A rod head is located at the front end of the rod core, and the rod head has multiple sample mesh mounting positions arranged along the axial direction of the sample rod. A first limiting portion is located on the side of the rod core. A limiting member is located between the rod body and the rod core, with a portion of the limiting member protruding from the rod body. Multiple second limiting portions are located inside the limiting member. The limiting member can rotate around the axial direction of the sample rod, allowing the first limiting portion to engage with different second limiting portions. Under the constraint of different second limiting portions, the rod core can move along the axial direction of the sample rod to different positions. The number of second limiting portions corresponds to the number of sample mesh mounting positions. By providing second limiting portions for different sample mesh mounting positions, different sample mesh mounting positions correspond to different rod core positions. When adjusting the rod core position, it can be adjusted to the correct position in one step, making the adjustment process more convenient and faster.

The application provides an electrode three-dimensional reconstruction segmentation method and device and electronic equipment. The method comprises: collecting multi-modal data; wherein the multi-modal data comprises morphological data and element data; constructing an implicit neural field model; wherein the input of the implicit neural field model is a spatial three-dimensional coordinate, and the output of the implicit neural field model is a probability vector of the spatial three-dimensional coordinate belonging to each phase; training the implicit neural field model based on a composite loss function of the multi-modal data; wherein the composite loss function comprises a data fidelity loss term and a physical prior loss term; and performing electrode three-dimensional reconstruction based on the trained implicit neural field model. In this way, the conductive agent, the binder and the pore phase with similar gray values in the composite electrode can be accurately segmented through multi-modal data fusion and physical prior constraints, so that the low-contrast image data obtained by using a focused ion beam-scanning electron microscope can be subjected to high-precision three-dimensional reconstruction.

The present invention relates to a circular molybdenum nanogrid sample support having an upper and lower dual silicon post structure and belongs to the field of high-precision sample support technology used in electron microscope analysis equipment. The sample support of the present invention has a structure in which two circular molybdenum (Mo) bodies are precisely interlocked and joined, and within this structure, silicon (Si) posts of various shapes are arranged at the upper and lower portions, respectively. Through this upper and lower dual silicon post structure, two samples can be simultaneously fixed and TEM, SEM, or FIB analysis can be performed using a single loading process, thereby maximizing analysis efficiency. Furthermore, the uppermost portion of the silicon posts can be processed into a flat or D-cut shape; this D-cut shape may or may not penetrate downwards, and allows for uniform or non-uniform shape distribution between the posts, enabling adaptation to various sample shapes and analysis purposes. The circular molybdenum nanogrid sample support of the present invention simultaneously secures high mechanical strength and conductivity, and enables precise mass production through semiconductor process-based MEMS technology. Thus, the present invention provides excellent technical effects in terms of simultaneous analysis of multiple samples, reduction of background noise, reprocessing of samples, and compatibility with various analytical instruments.

The present disclosure provides an in-situ testing system of metal materials under high temperature and complex loads. The testing system includes a fatigue testing unit, a high-temperature loading unit, a signal detecting unit and a base. The fatigue testing unit is configured for pre-tightening a sample and then performing a fatigue testing on the sample. The high-temperature loading unit is configured for heating the sample to a high temperature. The signal detecting unit includes a pressure sensor and a displacement sensor. The pressure sensor is configured for monitoring the tensile force on the sample. The displacement sensor is configured for monitoring the displacement of the sample after being stretched during the pre-tightening of the sample. The base is configured for bearing the fatigue testing unit, the high-temperature loading unit and the signal detecting unit, and can be positioned on a scanning electron microscope stage or an open microscopic device.

1. The name of the design product: cell phone microscope. 2. The use of the design product: for installation on a cell phone, used as an electronic microscope. 3. The design points of the design product: in shape. 4. The picture or photo that best shows the design points: perspective view 1.

Provided are positive electrode active material particles with which it is possible to achieve both long life and low resistance. Each positive electrode active material particle comprises a core particle and a coating layer that coats the surface of the core particle. The core particle is formed of a first composite oxide. The first composite oxide contains lithium and at least one element selected from the group consisting of manganese, cobalt, nickel, aluminum, iron, and phosphorus. The coating layer is formed of a second composite oxide. The second composite oxide contains lithium and at least one element selected from the group consisting of niobium, boron, phosphorus, zirconium, titanium, aluminum, lanthanum, and tungsten. The coverage of the coating layer with respect to the core particles as calculated by observing the positive electrode active material particles by using a scanning electron microscope is 90.0 area% or more. The average thickness of the coating layer is 15.0 nm or less, and the maximum thickness of the coating layer is 15.0 nm or less.

The application relates to a kind of intelligent detection and quantitative evaluation methods of residual powder of porous structure bone implant instrument based on visual identification, relate to nondestructive testing technical field, to solve the problem of low efficiency, limited precision, strong subjectivity of traditional residual powder detection technology, the following steps are innovated in the application: using high-resolution electron microscope (SEM) and dual-mode cooperative acquisition technology of computer tomography (CT), the pictures of surface topography features and internal residual powder state of porous structure are obtained, the images are preprocessed in batches using Matlab, the residual powder is positioned using Otsu method and U-Net model, the particle size distribution characteristics of residual powder are quantified, the geometric characteristics of porous structure, the multi-scale feature fusion is carried out on the preprocessed image, the accurate positioning of residual powder, lightweight preliminary screening, output high confidence residual powder distribution and feature map, finally, the spatial distribution, morphological characteristics and melting state of residual powder are quantified, and quality detection evaluation is output, the application can realize efficient identification and quality detection of residual powder of porous structure bone implant instrument.

This invention provides a quantitative characterization method for solid particles or pores in solid propellants: An image of the solid propellant's surface morphology is obtained using scanning electron microscopy or optical microscopy. An appropriate threshold is selected, and the image is binarized using a particle identification system (PCAS). Then, by setting parameters such as the pore throat closure radius and the minimum pore area, the white areas in the binary image are identified and calculated, yielding parameters such as the content, distribution, and morphological characteristics of particles or pores in the propellant. This invention has the advantages of simple operation, high accuracy, and broad applicability.

Method for fabricating a microchip are provided which may comprise forming a dopant mask layer on a front side surface of a silicon substrate having the front side surface and an opposing back side surface; removing a portion of the dopant mask layer according to a pattern to form a first exposed silicon region in the silicon substrate and a first unexposed silicon region in the silicon substrate; doping the first exposed silicon region in the silicon substrate with a p-type dopant to form a first p-type doped silicon region in the silicon substrate; forming a silicon nitride layer on the front side surface of the silicon substrate comprising the first p-type doped silicon region and the first unexposed silicon region; and forming an opening in the silicon substrate from the opposing back side surface of the silicon substrate to provide a microchip comprising the silicon substrate having the opening, a first silicon nitride window positioned within the opening, and a support structure mounted to the first silicon nitride window, the support structure comprising the first p-type doped silicon region. The fabricated microchips and methods of using the microchips are also provided.