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Joint test method for maximum power regression and adjacent channel leakage ratio

A technology of maximum transmission power and joint testing, which is applied in the direction of improving amplifiers to reduce nonlinear distortion, transmission monitoring, receiver monitoring, etc., and can solve problems such as impact and no maximum transmission power fallback value

Inactive Publication Date: 2010-06-16
ZTE CORP
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  • Description
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AI Technical Summary

Problems solved by technology

However, after the maximum transmit power is rolled back, other parameters of the entire system may be affected
For each system, the maximum transmit power backoff value will be defined through testing or simulation, but there is no test method for whether the maximum transmit power backoff value is reasonable in the prior art

Method used

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  • Joint test method for maximum power regression and adjacent channel leakage ratio
  • Joint test method for maximum power regression and adjacent channel leakage ratio
  • Joint test method for maximum power regression and adjacent channel leakage ratio

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Embodiment Construction

[0028] Taking the LTE system as an example, the MPR test is related to the modulation mode, system bandwidth and whether the resource blocks are complete. Therefore, these parameters must be additionally set in the test to ensure that the test is performed under the correct conditions.

[0029] For example, in the QPSK modulation mode, the system bandwidth is 5MHz, and when the RB (resource block, wireless resource unit in LTE) is greater than 8, the MPR shall not be greater than 1:

[0030] The test environment includes test temperature and test voltage. The test temperature is divided into extreme high temperature and low temperature (generally between -10 and +55 degrees Celsius), as well as general temperature conditions. The test voltage is also divided into high-voltage, low-voltage and general voltage conditions. The temperature and voltage settings in the test are generally combined by the above extreme conditions, and the general temperature and general voltage condi...

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PUM

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Abstract

The invention provides a test method for MPR (maximum power regression), which adds a test for the MPR (maximum power regression) into the test for an ACLR (adjacent channel leakage ratio), and judges whether the maximum power regression meets the requirement by testing the adjacent channel leakage ratio. The method comprises the following steps: establishing a test loop, and ensuring that UE is operated in a loopback mode; setting relative parameters of the MPR; setting a testing environment according to the test requirements of the MPR and the ACLR; transmitting continuous uplink power control commands to the UE to enable a system to enter a normal working state; testing an ACLR value; resetting the relative parameters of the MPR; repeating the steps above; testing a new ACLR; and judging whether the new ACLR value meets the requirement under new conditions.

Description

technical field [0001] The present invention relates to a kind of test method of MPR (maximum transmit power fallback), especially relate to adding the test of MPR (maximum transmit power fallback) into the test of ACLR (adjacent channel leakage ratio), by testing the adjacent channel leakage ratio , to determine whether the fallback of the maximum transmit power meets the requirements. Background technique [0002] The nonlinear distortion of the RF power amplifier will cause it to generate new frequency components, such as the second harmonic for the second-order distortion, and the third harmonic for the third-order distortion. If these new frequency components fall within the passband, they will cause direct interference to the transmitted signal, and if they fall outside the passband, they will interfere with signals of other channels. Amplifiers have a linear dynamic range in which the output power of the amplifier increases linearly. As the input power continues to ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04B17/00H03F1/32
CPCH04B17/004Y02B60/50H04W24/06H04W88/02H04B17/20Y02D30/70
Inventor 王曼
Owner ZTE CORP
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